Oxide field dependence of interface trap generation during negative bias temperature instability in PMOS

Author(s):  
M. Denais ◽  
V. Huard ◽  
C. Parthasarathy ◽  
G. Ribes ◽  
F. Perrier ◽  
...  
2016 ◽  
Vol 108 (1) ◽  
pp. 012106 ◽  
Author(s):  
Cheng-Tyng Yen ◽  
Chien-Chung Hung ◽  
Hsiang-Ting Hung ◽  
Chwan-Ying Lee ◽  
Lurng-Shehng Lee ◽  
...  

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