Oxide field dependence of interface trap generation during negative bias temperature instability in PMOS
2007 ◽
Vol 54
(9)
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pp. 2143-2154
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2011 ◽
Vol 50
(1R)
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pp. 014302
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2014 ◽
Vol 54
(1)
◽
pp. 22-29
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2019 ◽
Vol 11
(4)
◽
pp. 04018-1-04018-6