Halogen-free materials for PWB and advanced package substrate

Author(s):  
H. Murai ◽  
Y. Tadeda ◽  
N. Takano ◽  
K. Ikeda
Keyword(s):  
Author(s):  
Dennis Clouthier ◽  
Phillip Sheridan ◽  
Bing Jin ◽  
Robert Grimminger
Keyword(s):  

Author(s):  
Bhanu Sood ◽  
Michael Pecht

Abstract Failures in printed circuit boards account for a significant percentage of field returns in electronic products and systems. Conductive filament formation is an electrochemical process that requires the transport of a metal through or across a nonmetallic medium under the influence of an applied electric field. With the advent of lead-free initiatives, boards are being exposed to higher temperatures during lead-free solder processing. This can weaken the glass-fiber bonding, thus enhancing conductive filament formation. The effect of the inclusion of halogen-free flame retardants on conductive filament formation in printed circuit boards is also not completely understood. Previous studies, along with analysis and examinations conducted on printed circuit boards with failure sites that were due to conductive filament formation, have shown that the conductive path is typically formed along the delaminated fiber glass and epoxy resin interfaces. This paper is a result of a year-long study on the effects of reflow temperatures, halogen-free flame retardants, glass reinforcement weave style, and conductor spacing on times to failure due to conductive filament formation.


Nano Research ◽  
2021 ◽  
Author(s):  
Ming Chen ◽  
Liming Xie ◽  
Changting Wei ◽  
Yuan-Qiu-Qiang Yi ◽  
Xiaolian Chen ◽  
...  

2021 ◽  
Vol 50 (5) ◽  
pp. 1594-1598
Author(s):  
Takeshi Nozawa ◽  
Toshiaki Kobayashi ◽  
Tomohiro Matsumoto ◽  
Fujio Yagihashi ◽  
Kazuhiko Sato ◽  
...  
Keyword(s):  

A halogen-free synthesis of methoxysilyl-substituted double-four-ring (D4R) siloxanes [Si8O12][OSiR(OMe)2] (R = OMe or vinyl) was accomplished.


Author(s):  
Edurne Avellanal Zaballa ◽  
Alejandro Prieto ◽  
Carolina Diaz Norambuena ◽  
Jorge Bañuelos ◽  
Antonia R Agarrabeitia ◽  
...  

Herein we detail a protocol to design dyads and triads based solely on BODIPY dyes as halogen-free singlet oxygen photosensitizers or energy transfer molecular cassettes. The conducted photonic characterization reveals...


2021 ◽  
Vol 13 (9) ◽  
pp. 11117-11124 ◽  
Author(s):  
Xingpeng Liu ◽  
Ruijie Ma ◽  
Yufei Wang ◽  
Sanshan Du ◽  
Junfeng Tong ◽  
...  

Author(s):  
Fenny Liu ◽  
C. T Yao ◽  
Don Son Jiang ◽  
Yu Po Wang ◽  
C. S. Hsiao
Keyword(s):  

Energies ◽  
2021 ◽  
Vol 14 (9) ◽  
pp. 2427
Author(s):  
Michał Szulborski ◽  
Sebastian Łapczyński ◽  
Łukasz Kolimas

The manuscript presents advanced coupled analysis: Maxwell 3D, Transient Thermal and Fluent CFD, at the time of a rated current occurring on the main busbars in the low-voltage switchgear. The simulations were procured in order to aid the design process of such enclosures. The analysis presented the rated current flow in the switchgear busbars, which allowed determining their temperature values. The main assumption of the simulation was measurements of temperature rise during rated current conditions. Simulating such conditions is a valuable asset in order to design better solutions for energy distribution gear. The simulation model was a precise representation of the actual prototype of the switchgear. Simulations results were validated by experimental research. The heat dissipation in busbars and switchgear housing through air convection was presented. The temperature distribution for the insulators in the rail bridge made of fireproof material was considered: halogen-free polyester. The results obtained during the simulation allowed for a detailed analysis of switchgear design and proper conclusions in practical and theoretical aspects. That helped in introducing structural changes in the prepared prototype of the switchgear at the design and construction stages. Deep analysis of the simulation results allowed for the development concerning the final prototype of the switchgear, which could be subjected to the full type tests. Additionally, short-circuit current simulations were procured and presented.


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