Post-Integrated Dual-Core Large-End Spot-Size Converter With Si Vertical Taper for Fiber Butt-Coupling to Si-Photonics Chip

2018 ◽  
Vol 36 (20) ◽  
pp. 4783-4791 ◽  
Author(s):  
Masatoshi Tokushima ◽  
Hitoshi Kawashima ◽  
Tsuyoshi Horikawa ◽  
Kazuhiko Kurata
2012 ◽  
Vol E95.C (7) ◽  
pp. 1272-1275
Author(s):  
Takanori SUZUKI ◽  
Hideo ARIMOTO ◽  
Takeshi KITATANI ◽  
Aki TAKEI ◽  
Takafumi TANIGUCHI ◽  
...  

2019 ◽  
Vol 32 (3) ◽  
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Hiroyuki Shibata ◽  
Tatsurou Hiraki ◽  
Tai Tsuchizawa ◽  
Koji Yamada ◽  
Yasuhiro Tokura ◽  
...  

2007 ◽  
Vol 25 (8) ◽  
pp. 2213-2218 ◽  
Author(s):  
Lianping Hou ◽  
Zhong Ren ◽  
Siyuan Yu ◽  
Hongliang Zhu ◽  
Wei Wang
Keyword(s):  

2005 ◽  
Vol 17 (11) ◽  
pp. 2259-2261 ◽  
Author(s):  
Lianping Hou ◽  
Hongliang Zhu ◽  
Qiang Kan ◽  
Ying Ding ◽  
Baojun Wang ◽  
...  

Author(s):  
Etienne de Harven

Biological ultrastructures have been extensively studied with the scanning electron microscope (SEM) for the past 12 years mainly because this instrument offers accurate and reproducible high resolution images of cell shapes, provided the cells are dried in ways which will spare them the damage which would be caused by air drying. This can be achieved by several techniques among which the critical point drying technique of T. Anderson has been, by far, the most reproducibly successful. Many biologists, however, have been interpreting SEM micrographs in terms of an exclusive secondary electron imaging (SEI) process in which the resolution is primarily limited by the spot size of the primary incident beam. in fact, this is not the case since it appears that high resolution, even on uncoated samples, is probably compromised by the emission of secondary electrons of much more complex origin.When an incident primary electron beam interacts with the surface of most biological samples, a large percentage of the electrons penetrate below the surface of the exposed cells.


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