4B7 - Precision spectroscopy of new infrared emission system of molecular nitrogen

1966 ◽  
Vol 2 (8) ◽  
pp. 229-232 ◽  
Author(s):  
R. McFarlane
Author(s):  
Gregor Hegi ◽  
Stefan Willitsch ◽  
Ilia Sergachev ◽  
Matthias Germann ◽  
Kaveh Najafian

1997 ◽  
Vol 161 ◽  
pp. 299-311 ◽  
Author(s):  
Jean Marie Mariotti ◽  
Alain Léger ◽  
Bertrand Mennesson ◽  
Marc Ollivier

AbstractIndirect methods of detection of exo-planets (by radial velocity, astrometry, occultations,...) have revealed recently the first cases of exo-planets, and will in the near future expand our knowledge of these systems. They will provide statistical informations on the dynamical parameters: semi-major axis, eccentricities, inclinations,... But the physical nature of these planets will remain mostly unknown. Only for the larger ones (exo-Jupiters), an estimate of the mass will be accessible. To characterize in more details Earth-like exo-planets, direct detection (i.e., direct observation of photons from the planet) is required. This is a much more challenging observational program. The exo-planets are extremely faint with respect to their star: the contrast ratio is about 10−10at visible wavelengths. Also the angular size of the apparent orbit is small, typically 0.1 second of arc. While the first point calls for observations in the infrared (where the contrast goes up to 10−7) and with a coronograph, the latter implies using an interferometer. Several space projects combining these techniques have been recently proposed. They aim at surveying a few hundreds of nearby single solar-like stars in search for Earth-like planets, and at performing a low resolution spectroscopic analysis of their infrared emission in order to reveal the presence in the atmosphere of the planet of CO H2O and O3. The latter is a good tracer of the presence of oxygen which could be, like on our Earth, released by biological activity. Although extremely ambitious, these projects could be realized using space technology either already available or in development for others missions. They could be built and launched during the first decades on the next century.


Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).


1981 ◽  
Vol 42 (C8) ◽  
pp. C8-29-C8-35
Author(s):  
V. A. Alekseev

Author(s):  
Jim Vickers ◽  
Nader Pakdaman ◽  
Steven Kasapi

Abstract Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and components that are required to scale and keep pace with the industry's requirements. It addresses the scalability of dynamic emission with the semiconductor advanced device roadmap. It is important to understand the limitations to determining that a switching event has occurred. The article explains the criteria for event detection, which is suitable for tracking signal propagation and looking for logic or other faults in which timing is not critical. It discusses conditions for event timing, whose goal is to determine accurately when a switching event has occurred, usually for speed path analysis. One of the uses of a dynamic emission system is to identify faults by studying the emission as a general function of time.


Author(s):  
Thierry Parrassin ◽  
Sylvain Dudit ◽  
Michel Vallet ◽  
Antoine Reverdy ◽  
Hervé Deslandes

Abstract By adding a transmission grating into the optical path of our photon emission system and after calibration, we have completed several failure analysis case studies. In some cases, additional information on the emission sites is provided, as well as understanding of the behavior of transistors that are associated to the fail site. The main application of the setup is used for finding and differentiating easily related emission spots without advance knowledge in light emission mechanisms in integrated circuits.


Author(s):  
Q. Kim ◽  
S. Kayali

Abstract In this paper, we report on a non-destructive technique, based on IR emission spectroscopy, for measuring the temperature of a hot spot in the gate channel of a GaAs metal/semiconductor field effect transistor (MESFET). A submicron-size He-Ne laser provides the local excitation of the gate channel and the emitted photons are collected by a spectrophotometer. Given the state of our experimental test system, we estimate a spectral resolution of approximately 0.1 Angstroms and a spatial resolution of approximately 0.9 μm, which is up to 100 times finer spatial resolution than can be obtained using the best available passive IR systems. The temperature resolution (<0.02 K/μm in our case) is dependent upon the spectrometer used and can be further improved. This novel technique can be used to estimate device lifetimes for critical applications and measure the channel temperature of devices under actual operating conditions. Another potential use is cost-effective prescreening for determining the 'hot spot' channel temperature of devices under normal operating conditions, which can further improve device design, yield enhancement, and reliable operation. Results are shown for both a powered and unpowered MESFET, demonstrating the strength of our infrared emission spectroscopy technique as a reliability tool.


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