A Mechanical Theory of Electron-Image Formation

1944 ◽  
Vol 32 (8) ◽  
pp. 483-493 ◽  
Author(s):  
K. Schlesinger
Keyword(s):  
Image Formation ◽  
Mechanical Theory ◽  
Electron Image

The 'well-known' theory of electron image formation

1983 ◽  
Vol 41 ◽  
pp. 288-289
Author(s):  
M.A. O'Keefe ◽  
W.O. Saxton
Keyword(s):  
Image Processing ◽  
Image Formation ◽  
Source Profiles ◽  
Electron Image

A recent paper by Kirkland on nonlinear electron image processing, referring to a relatively new textbook, highlights the persistence in the literature of calculations based on incomplete and/or incorrect models of electron imageing, notwithstanding the various papers which have recently pointed out the correct forms of the appropriate equations. Since at least part of the problem can be traced to underlying assumptions about the illumination coherence conditions, we attempt to clarify both the assumptions and the corresponding equations in this paper, illustrating the effects of an incorrect theory by means of images calculated in different ways.The first point to be made clear concerning the illumination coherence conditions is that (except for very thin specimens) it is insufficient simply to know the source profiles present, i.e. the ranges of different directions and energies (focus levels) present in the source; we must also know in general whether the various illumination components are coherent or incoherent with respect to one another.

Electron Microscopy in Molecular Biology

1967 ◽  
Vol 25 ◽  
pp. 2-3
Author(s):  
Cecil E. Hall
Keyword(s):  
Electron Microscopy ◽  
Molecular Biology ◽  
Noise Level ◽  
Molecular Structures ◽  
Material Structure ◽  
The Arts ◽  
Shadow Casting ◽  
Electron Image ◽  
High Degree ◽  
Very High

The visualization of organic macromolecules such as proteins, nucleic acids, viruses and virus components has reached its high degree of effectiveness owing to refinements and reliability of instruments and to the invention of methods for enhancing the structure of these materials within the electron image. The latter techniques have been most important because what can be seen depends upon the molecular and atomic character of the object as modified which is rarely evident in the pristine material. Structure may thus be displayed by the arts of positive and negative staining, shadow casting, replication and other techniques. Enhancement of contrast, which delineates bounds of isolated macromolecules has been effected progressively over the years as illustrated in Figs. 1, 2, 3 and 4 by these methods. We now look to the future wondering what other visions are waiting to be seen. The instrument designers will need to exact from the arts of fabrication the performance that theory has prescribed as well as methods for phase and interference contrast with explorations of the potentialities of very high and very low voltages. Chemistry must play an increasingly important part in future progress by providing specific stain molecules of high visibility, substrates of vanishing “noise” level and means for preservation of molecular structures that usually exist in a solvated condition.

Observation of Phase Contrast Images in STEM and CTEM Modes by Using 100 kV Field Emission Electron Gun

1974 ◽  
Vol 32 ◽  
pp. 390-391
Author(s):  
Y. Harada ◽  
T. Goto ◽  
H. Koike ◽  
T. Someya
Keyword(s):  
Field Emission ◽  
Phase Contrast ◽  
Image Formation ◽  
Fresnel Diffraction ◽  
Experimental Results ◽  
Electron Gun ◽  
Scanning Microscopy ◽  
Emission Electron ◽  
Lattice Images

Since phase contrasts of STEM images, that is, Fresnel diffraction fringes or lattice images, manifest themselves in field emission scanning microscopy, the mechanism for image formation in the STEM mode has been investigated and compared with that in CTEM mode, resulting in the theory of reciprocity. It reveals that contrast in STEM images exhibits the same properties as contrast in CTEM images. However, it appears that the validity of the reciprocity theory, especially on the details of phase contrast, has not yet been fully proven by the experiments. In this work, we shall investigate the phase contrast images obtained in both the STEM and CTEM modes of a field emission microscope (100kV), and evaluate the validity of the reciprocity theory by comparing the experimental results.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Edge Penetration Effects in the Low-Loss Electron Image in the SEM

1988 ◽  
Vol 46 ◽  
pp. 202-203
Author(s):  
Oliver C. Wells
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Beam Energy ◽  
Secondary Electron ◽  
Sharp Edge ◽  
Beam Diameter ◽  
Low Loss ◽  
Additional Information ◽  
Electron Image ◽  
Scanning Electron

The low-loss electron (LLE) image in the scanning electron microscope (SEM) is useful for the study of uncoated photoresist and some other poorly conducting specimens because it is less sensitive to specimen charging than is the secondary electron (SE) image. A second advantage can arise from a significant reduction in the width of the “penetration fringe” close to a sharp edge. Although both of these problems can also be solved by operating with a beam energy of about 1 keV, the LLE image has the advantage that it permits the use of a higher beam energy and therefore (for a given SEM) a smaller beam diameter. It is an additional attraction of the LLE image that it can be obtained simultaneously with the SE image, and this gives additional information in many cases. This paper shows the reduction in penetration effects given by the use of the LLE image.

The DQE of an electron image recording system

1978 ◽  
Vol 36 (1) ◽  
pp. 100-101
Author(s):  
K.-H. Herrmann ◽  
D. Krahl ◽  
H.-P Rust
Keyword(s):  
Primary Electron ◽  
Ideal Case ◽  
Image Recording ◽  
Main Requirement ◽  
High Detection ◽  
Electron Image ◽  
Video Amplifier ◽  
Detection Quantum Efficiency ◽  
Selection Of ◽  
The Ideal

The high detection quantum efficiency (DQE) is the main requirement for an imagerecording system used in electron microscopy of radiation-sensitive specimens. An electronic TV system of the type shown in Fig. 1 fulfills these conditions and can be used for either analog or digital image storage and processing [1], Several sources of noise may reduce the DQE, and therefore a careful selection of various elements is imperative.The noise of target and of video amplifier can be neglected when the converter stages produce sufficient target electrons per incident primary electron. The required gain depends on the type of the tube and also on the type of the signal processing chosen. For EBS tubes, for example, it exceeds 10. The ideal case, in which all impinging electrons create uniform charge peaks at the target, is not obtainable for several reasons, and these will be discussed as they relate to a system with a scintillator, fiber-optic and photo-cathode combination as the first stage.

A light optical diffractometer for electron microscopical images operating in line

1978 ◽  
Vol 36 (1) ◽  
pp. 86-87
Author(s):  
P. Bonhomme ◽  
A. Beorchia
Keyword(s):  
Electron Microscopy ◽  
Electron Transfer ◽  
Electron Microscope ◽  
Image Converter ◽  
Coherent Light ◽  
Spatial Filters ◽  
Electron Image ◽  
Electron Microscopical ◽  
Working Parameters ◽  
Amorphous Part

We have already described (1.2.3) a device using a pockel's effect light valve as a microscopical electron image converter. This converter can be read out with incoherent or coherent light. In the last case we can set in line with the converter an optical diffractometer. Now, electron microscopy developments have pointed out different advantages of diffractometry. Indeed diffractogram of an image of a thin amorphous part of a specimen gives information about electron transfer function and a single look at a diffractogram informs on focus, drift, residual astigmatism, and after standardizing, on periods resolved (4.5.6). These informations are obvious from diffractogram but are usualy obtained from a micrograph, so that a correction of electron microscope parameters cannot be realized before recording the micrograph. Diffractometer allows also processing of images by setting spatial filters in diffractogram plane (7) or by reconstruction of Fraunhofer image (8). Using Electrotitus read out with coherent light and fitted to a diffractometer; all these possibilities may be realized in pseudoreal time, so that working parameters may be optimally adjusted before recording a micrograph or before processing an image.

Cellulose Acetate Reverse Osmosis Membrane Structure

1972 ◽  
Vol 30 ◽  
pp. 528-529
Author(s):  
H. K. Plummer ◽  
E. Eichen ◽  
C. D. Melvin
Keyword(s):  
Cellulose Acetate ◽  
Reverse Osmosis ◽  
Membrane Structure ◽  
Freeze Drying ◽  
Dense Layer ◽  
Water Removal ◽  
Reverse Osmosis Membrane ◽  
Correct Interpretation ◽  
Electron Image ◽  
Scanning Electron

Much of the work reported in the literature on cellulose acetate reverse osmosis membranes has raised new and important questions with regard to the dense or “active” layer of these membranes. Several thickness values and structures have been attributed to the dense layer. To ensure the correct interpretation of the cellulose acetate structure thirteen different preparative techniques have been used in this investigation. These thirteen methods included various combinations of water substitution, freeze drying, freeze sectioning, fracturing, embedding, and microtomy techniques with both transmission and scanning electron microscope observations.It was observed that several factors can cause a distortion of the structure during sample preparation. The most obvious problem of water removal can cause swelling, shrinking, and folds. Improper removal of embedding materials, when used, can cause a loss of electron image contrast and, or structure which could hinder interpretation.

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