A single event transient hardening circuit design technique based on strengthening

2013 ◽  
Author(s):  
A. Calomarde ◽  
E. Amat ◽  
F. Moll ◽  
A. Rubio
Keyword(s):  
Circuit Design ◽  
Single Event ◽  
Design Technique ◽  
Single Event Transient

A SEE Hardened Read-Out Circuit of EEPROM for Space Application

2012 ◽  
Vol 198-199 ◽  
pp. 1105-1109
Author(s):  
Xin Jie Zhou ◽  
Jing He Wei ◽  
Lei Lei Li
Keyword(s):  
Circuit Design ◽  
Space Application ◽  
Single Event Upset ◽  
Single Event ◽  
Single Event Transient ◽  
Single Event Effect ◽  
Radiation Hardened

As wide application of EEPROM devices in space and military field, more and more researches focus on its radiation hardened characteristics in international. To improve the single-event effect (SEE) tolerant ability of read-out circuits in the memory, a radiation hardened circuit is designed. The design kernels of radiation hardened latch-flip are given and designed to resist the single-event upset (SEU) effect. A correction circuit is proposed to resist the single-event transient (SET) effect. The performances of this design are: SEU (LET)th ≥ 27 MeV•cm2/mg, SEL(LET)th ≥ 75 MeV•cm2/mg , read out time ≤200 ns. The new design not only satisfied the needs of present work, but supplies a worthful reference for radiation hardened circuit design in future.

Improved on-chip self-triggered single-event transient measurement circuit design and applications

2017 ◽  
Vol 71 ◽  
pp. 99-105 ◽  
Author(s):  
Rongmei Chen ◽  
Wei Chen ◽  
Xiaoqiang Guo ◽  
Chen Shen ◽  
Fengqi Zhang ◽  
...  
Keyword(s):  
Circuit Design ◽  
Single Event ◽  
Measurement Circuit ◽  
Single Event Transient ◽  
On Chip ◽  
Transient Measurement

scholarly journals Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty

Electronics ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 27
Author(s):  
Jingtian Liu ◽  
Qian Sun ◽  
Bin Liang ◽  
Jianjun Chen ◽  
Yaqing Chi ◽  
...  
Keyword(s):  
Circuit Design ◽  
Analog Circuits ◽  
Analog Circuit ◽  
Forward Bias ◽  
Cmos Technology ◽  
Common Source ◽  
Single Event ◽  
Single Event Transient ◽  
Body Effect ◽  
Radiation Hardened

In analog circuit design, the bulks of MOSFETs can be tied to their respective sources to remove body effect. This paper models and analyzes the sensitivity of single-event transients (SETs) in common source (CS) amplifier with bulk tied to source (BTS) in 40 nm twin-well bulk CMOS technology. The simulation results present that the proposed BTS radiation-hardened-by-design (RHBD) technique can reduce charge collection and suppress the SET induced perturbation effectively in various input conditions of the circuit. The detailed analysis shows that the mitigation of SET is primarily due to the forward-bias of bulk potential. This technique is universally applicable in radiation-hardening design for analog circuits with negligible penalty.

Radiation Effects on a Small DC-DC Converter and a Remedy by Circuit Design Technique

2002 ◽  
Author(s):  
C. H. Truong ◽  
E. J. Simburger ◽  
R. C. Lacoe ◽  
J. C. Ross ◽  
S. Brown
Keyword(s):  
Circuit Design ◽  
Radiation Effects ◽  
Design Technique

Single Event Transient (SET) Mitigation Circuits with Immune Leaf Nodes

2021 ◽  
pp. 1-1
Author(s):  
Faisal Mustafa Sajjade ◽  
Neeraj Kumar Goyal ◽  
B.K.S.V.L Varaprasad
Keyword(s):  
Single Event ◽  
Single Event Transient
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