Mechanical Properties and Deformation Behavior of ZnO Thin Films under Illumination

Author(s):  
Peter Horvath ◽  
George Kiriakidis ◽  
Peter M. Nagy ◽  
Savas Christoulakis
2007 ◽  
Vol 61 (11-12) ◽  
pp. 2443-2445 ◽  
Author(s):  
R. Navamathavan ◽  
Kyoung-Kook Kim ◽  
Dae-Kue Hwang ◽  
Seong-Ju Park ◽  
Tae Geol Lee ◽  
...  

2008 ◽  
Vol 6 (4) ◽  
pp. 558-563 ◽  
Author(s):  
P. Horvath ◽  
S. B. Sadale ◽  
M. Suchea ◽  
S. Christoulakis ◽  
R. Voicu ◽  
...  

1992 ◽  
Vol 7 (6) ◽  
pp. 1553-1563 ◽  
Author(s):  
Martha K. Small ◽  
W.D. Nix

Since its first application to thin films in the 1950's the bulge test has become a standard technique for measuring thin film mechanical properties. While the apparatus required for the test is simple, interpretation of the data is not. Failure to recognize this fact has led to inconsistencies in the reported values of properties obtained using the bulge test. For this reason we have used the finite element method to model the deformation behavior of a thin film in a bulge test for a variety of initial conditions and material properties. In this paper we will review several of the existing models for describing the deformation behavior of a circular thin film in a bulge test, and then analyze these models in light of the finite element results. The product of this work is a set of equations and procedures for analyzing bulge test data that will improve the accuracy and reliability of this technique.


2014 ◽  
Vol 38 ◽  
pp. 87-91 ◽  
Author(s):  
Sheng Hsiung Chang ◽  
Hsin-Ming Cheng ◽  
Chuen-Lin Tien ◽  
Shih-Chin Lin ◽  
Kie-Pin Chuang

2010 ◽  
Vol 519 (1) ◽  
pp. 325-330 ◽  
Author(s):  
Konstantinos A. Sierros ◽  
Derrick A. Banerjee ◽  
Nicholas J. Morris ◽  
Darran R. Cairns ◽  
Ioannis Kortidis ◽  
...  

2016 ◽  
Vol 16 (03) ◽  
pp. 1650036
Author(s):  
V. Malapati ◽  
R. Singh

ZnO thin films were deposited on quartz substrates by RF sputtering under argon, oxygen and nitrogen gas environment. The as deposited films showed hexagonal wurtzite structure with (002) orientation along c-axis. The mechanical properties of films with thickness ranging from 842[Formula: see text]nm to 1067[Formula: see text]nm and grain size 94–124[Formula: see text]nm were studied using nanoindentation technique. The Young’s modulus and hardness of the films were in the range 76–257[Formula: see text]GPa and 5–18[Formula: see text]GPa, respectively. Both parameters decreased with increase in indentation depth of the films. The spatial distribution of these parameters were strongly dependent on the gas environment used for film deposition.


2011 ◽  
Vol 257 (17) ◽  
pp. 7900-7905 ◽  
Author(s):  
C.-Y. Yen ◽  
S.-R. Jian ◽  
G.-J. Chen ◽  
C.-M. Lin ◽  
H.-Y. Lee ◽  
...  

2020 ◽  
Vol 65 ◽  
pp. 27-38
Author(s):  
Sara Benzitouni ◽  
Mourad Zaabat ◽  
Jean Ebothé ◽  
Abdelhakim Mahdjoub ◽  
Meriem Guemini

Undoped and transition metals (TM = Cr, Ni, Mn and Cd) doped zinc oxide (ZnO) thin films were prepared by sol-gel dip-coating method on glass substrates at 300 °C. In this study, the effect of dopant material on the structural, morphological, optical, electrical and mechanical properties of ZnO thin films is investigated by using XRD, AFM, UV-Vis, Hall effect and nanoindentation techniques, respectively. Nanocrystalline films with a ZnO hexagonal wurtzite structure and two preferred orientations (002) and (103) were obtained. UV-Vis transmittance spectra showed that all the films are highly transparent in the visible region (> 80 %). Moreover, the optical band gap of the films decreased to 3.13 eV with an increasing orbital occupation number of 3d electrons. AFM-topography shows that the films are dense, smooth and uniform, except for the high roughness RMS =26.3 nm obtained for Cd-doped ZnO. Finally, the dopant material is found to have a significant effect on the mechanical behavior of ZnO as compared to the undoped material. For Ni and Cd dopants, analysis of load and unload data yields an increase in the hardness (8.96 ± 0.22 GPa) and Young’s modulus (122 ± 7.46 GPa) of ZnO as compared to Cr and Mn dopants. Therefore, Ni and Cd are the appropriate dopants for the design and application of ZnO-based nanoelectromechanical systems.


Sign in / Sign up

Export Citation Format

Share Document