Evaluation of self-magnetically-pinched diodes as high-resolution, high-voltage radiography sources

Author(s):  
S.B. Swanekamp ◽  
G. Cooperstein ◽  
J.W. Schumer ◽  
D. Mosher ◽  
F.C. Young ◽  
...  
Keyword(s):  
Author(s):  
J.M. Cowley

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.


Author(s):  
Benjamin M. Siegel

The potential advantages of high voltage electron microscopy for extending the limits of resolution and contrast in imaging low contrast objects, such as biomolecular specimens, is very great. The results of computations will be presented showing that at accelerating voltages of 500-1000 kV it should be possible to achieve spacial resolutions of 1 to 1.5 Å and using phase contrast imaging achieve adequate image contrast to observe single atoms of low atomic number.The practical problems associated with the design and utilization of the high voltage instrument are, optimistically, within the range of competence of the state of the art. However, there are some extremely important and critical areas to be systematically investigated before we have achieved this competence. The basic electron optics of the column required is well understood, but before the full potential of an instrument capable of resolutions of better than 1.5 Å are realized some very careful development work will be required. Of great importance for the actual achievement of high resolution with a high voltage electron microscope is the fundamental limitation set by the characteristics of the high voltage electron beam that can be obtained from the accelerator column.


Author(s):  
David J. Smith

The initial attractions of the high voltage electron microscope (HVEM) stemmed mainly from the possibility of considerable increases in electron penetration through thick specimens compared with conventional 100KV microscopes, although the potential improvement in resolution associated with the decrease in election wavelength had been fully appreciated for many years (eg. Cosslett, 1946)1, even if not realizable in practice. Subsequent technological advances enabled the performance of lower voltage machines to be brought closer to the theoretical limit, to be followed in turn by more recent projects which have been successful, eventually, in achieving even higher resolution with dedicated higher voltage instruments such as those at Kyoto (500KV)2, Munich (400KV)3, Ibaraki (1250KV)4 and Cambridge (600KV)5. It does not necessarily follow however that the performance of journal high voltage microscopes can be easily upgraded, retrospectively, to the same level, as will be discussed in detail below.


1984 ◽  
Vol 86 ◽  
pp. 124-124
Author(s):  
T.J. McIlrath ◽  
V. Kaufman ◽  
J. Sugar ◽  
W.T. Hill ◽  
D. Cooper

Rapid ionization of Cs vapor in a heat pipe at 0.05 torr was achieved by pumping the 6s 2S½ – 7p 2P½ transition (f=0.007)1 with a flash-pumped dye laser at 4593.2A and I MW power output. Photoabsorptian initiated at the end of the laser pulse(≃ 0.5/s) showed the 5p5ns and nd series below and above the 5p52P3/2 threshold at 535.4A. Broad Beutler - Fano resonances appeared in the d series above threshold. The spectrum was recorded photographically on a 10.7m grazing incidence spectrograph using a continuum background generated by a BRV high-voltage spark source with a uranium anode. We will compare the line-shapes and the quantum defect (Lu-Fano2) plot with the predictions of a relativistic random phase calculation.


2020 ◽  
Vol 56 (36) ◽  
pp. 4886-4889 ◽  
Author(s):  
Jing Lai ◽  
Jun Zhang ◽  
Zuowei Li ◽  
Yao Xiao ◽  
Weibo Hua ◽  
...  

A splitting of two O3 phases, rather than the often observed O1 phases in the conventional LiCoO2 electrode, was discovered in the LiNi0.85Co0.10Mn0.05O2 at high-voltage region (>4.6 V) by in situ high-resolution synchrotron radiation diffraction.


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