Characterization of grain boundary properties in BaSi2 epitaxial films on Si(111) and Si(001) by Kelvin probe force microscopy
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2018 ◽
Vol 29
(24)
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pp. 20718-20725
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2017 ◽
Vol 164
(7)
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pp. C342-C348
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2003 ◽
Vol 150
(6)
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pp. B274
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2013 ◽
Vol 10
(7-8)
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pp. 1172-1175
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