Investigation of Hot Carrier Degradation Modes in LDMOS by using a Novel Three-Region Charge Pumping Technique

2006 ◽  
Author(s):  
C.c. Cheng ◽  
K.c. Tu ◽  
Tahui Wang ◽  
T.h. Hsieh ◽  
J.t. Tzeng ◽  
...  
Keyword(s):  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation ◽  
Degradation Modes

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

The Energy-Driven Hot-Carrier Degradation Modes of nMOSFETs

2007 ◽  
Vol 7 (2) ◽  
pp. 225-235 ◽  
Author(s):  
ChloÉ Guerin ◽  
Vincent Huard ◽  
Alain Bravaix
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation ◽  
Degradation Modes

Coupling between hot-carrier degradation modes of pMOSFETs

1997 ◽  
Author(s):  
Vijay Janapaty ◽  
Bharat L. Bhuva ◽  
N. Bui ◽  
Sherra E. Kerns
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation ◽  
Degradation Modes
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