Hot carrier degradation in MOSFETs: a charge pumping study

1993 ◽  
Vol 8 (4) ◽  
pp. 549-554 ◽  
Author(s):  
N C Das ◽  
V Nathan
1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES

Author(s):  
Bikram Kishore Mahajan ◽  
Yen-Pu Chen ◽  
Dhanoop Varghese ◽  
Vijay Reddy ◽  
Srikanth Krishnan ◽  
...  

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