A study of hot carrier degradation in NMOSEET's by gate capacitance and charge pumping current

1995 ◽  
Vol 42 (7) ◽  
pp. 1321-1328 ◽  
Author(s):  
C.H. Ling ◽  
S.E. Tan ◽  
D.S. Ang
Keyword(s):  
Charge Pumping ◽  
Hot Carrier ◽  
Gate Capacitance ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance

1995 ◽  
Vol 42 (5) ◽  
pp. 928-934 ◽  
Author(s):  
C.H. Ling ◽  
B.P. Seah ◽  
G.S. Samudra ◽  
C.H. Gan
Keyword(s):  
Hot Carrier ◽  
Gate Capacitance ◽  
Hot Carrier Degradation

Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique

2021 ◽  
Author(s):  
Bikram Kishore Mahajan ◽  
Yen-Pu Chen ◽  
Dhanoop Varghese ◽  
Vijay Reddy ◽  
Srikanth Krishnan ◽  
...  
Keyword(s):  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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