ACUTE: a high performance analog complementary polysilicon emitter bipolar technology utilizing SOI/trench full dielectric isolation

Author(s):  
R.C. Jerome ◽  
I.R.C. Post ◽  
T.G. Travnicek ◽  
G.M. Wodek ◽  
K.E. Huffstater ◽  
...  
1993 ◽  
Vol 04 (03) ◽  
pp. 283-299
Author(s):  
T. M. LIU ◽  
R. G. SWARTZ ◽  
T.Y. CHIU

With the increasing maturity of conventional Bipolar-CMOS (BiCMOS) technologies, a new category of BiCMOS called "ECL-BiCMOS" or high performance BiCMOS technology has emerged. These ECL-BiCMOS technologies offer not only high density CMOS capability, but also feature high speed bipolar devices for emitter couple logic (ECL) and mixed analog/digital applications. Since many process requirements of advanced bipolar technology differ from those of CMOS, to fabricate high speed bipolar devices without compromising CMOS performance is the primary challenge. In this paper, we discuss key process integration issues and review various approaches. In particular, we describe a recently developed half-micron super self-aligned BiCMOS technology. Together with high density/high speed CMOS, multi-GHz communication bipolar circuit results are presented to show the potential of high performance BiCMOS technology.


1987 ◽  
Vol 31 (6) ◽  
pp. 617-626 ◽  
Author(s):  
J. M. C. Stork ◽  
E. Ganin ◽  
J. D. Cressler ◽  
G. L. Patton ◽  
G. A. Sai-Halasz

Author(s):  
Warnock ◽  
Cressler ◽  
Burghartz ◽  
Harame ◽  
Jenkins ◽  
...  

1991 ◽  
Vol 12 (6) ◽  
pp. 315-317 ◽  
Author(s):  
J. Warnock ◽  
J.D. Cressler ◽  
K.A. Jenkins ◽  
C. Stanis ◽  
J.Y.C. Sun ◽  
...  

1987 ◽  
Vol 34 (11) ◽  
pp. 2246-2254 ◽  
Author(s):  
G.P. Li ◽  
T.H. Ning ◽  
C.T. Chuang ◽  
M.B. Ketchen ◽  
D.D.-L. Tang ◽  
...  

2001 ◽  
Vol 11 (01) ◽  
pp. 35-76 ◽  
Author(s):  
MARTIN WURZER ◽  
THOMAS F. MEISTER ◽  
JOSEF BÖCK ◽  
HERBERT SCHÄFER ◽  
KLAUS AUFINGER ◽  
...  

In this paper we present Si and SiGe bipolar technologies and circuits suited for present and future high-performance communication systems. The silicon bipolar technology described has an implanted base and, without increase in process complexity in comparison to current production technologies, transit frequencies of 52 GHz and maximum oscillation frequencies of 65 GHz are achieved. The transistors of the described epitaxial SiGe-base technologies exhibit transit frequencies of 81 GHz and maximum oscillation frequencies of 95 GHz. Measurement results of circuits realized in these technologies for low power and high-speed applications are presented: a 43 GHz low power dynamic frequency divider, a 23 GHz monolithically integrated oscillator, a 40 Gb/s clock and data (CDR) recovery realized in the pure silicon bipolar technology, and a 53 GHz static frequency divider, a 79 GHz dynamic frequency divider and a 20 GHz/27 mW dual-modulus prescaler in the SiGe technology.


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