Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures

2011 ◽  
Vol 8 (2) ◽  
pp. 308-314 ◽  
Author(s):  
Marta Portela-Garcia ◽  
Celia Lopez-Ongil ◽  
Mario Garcia Valderas ◽  
Luis Entrena
Keyword(s):  
2021 ◽  
Vol 20 (3) ◽  
pp. 1-25
Author(s):  
James Marshall ◽  
Robert Gifford ◽  
Gedare Bloom ◽  
Gabriel Parmer ◽  
Rahul Simha

Increased access to space has led to an increase in the usage of commodity processors in radiation environments. These processors are vulnerable to transient faults such as single event upsets that may cause bit-flips in processor components. Caches in particular are vulnerable due to their relatively large area, yet are often omitted from fault injection testing because many processors do not provide direct access to cache contents and they are often not fully modeled by simulators. The performance benefits of caches make disabling them undesirable, and the presence of error correcting codes is insufficient to correct for increasingly common multiple bit upsets. This work explores building a program’s cache profile by collecting cache usage information at an instruction granularity via commonly available on-chip debugging interfaces. The profile provides a tighter bound than cache utilization for cache vulnerability estimates (50% for several benchmarks). This can be applied to reduce the number of fault injections required to characterize behavior by at least two-thirds for the benchmarks we examine. The profile enables future work in hardware fault injection for caches that avoids the biases of existing techniques.


2011 ◽  
Vol 1 (4) ◽  
pp. 265-270 ◽  
Author(s):  
Sho Endo ◽  
Takeshi Sugawara ◽  
Naofumi Homma ◽  
Takafumi Aoki ◽  
Akashi Satoh

Author(s):  
Takuji Miki ◽  
Makoto Nagata

Abstract Cryptographic ICs on edge devices for internet-of-things (IoT) applications are exposed to an adversary and threatened by malicious side channel analysis. On-chip analog monitoring by sensor circuits embedded inside the chips is one of the possible countermeasures against such attacks. An on-chip monitor circuit consisting of a successive approximation register (SAR) analog-to-digital converter (ADC) and an input buffer acquires a wideband signal, which enables to detects an irregular noise due to an active fault injection and a passive side channel leakage analysis. In this paper, several countermeasures against security attacks utilizing wideband on-chip monitors are reviewed. Each technique is implemented on a prototype chip, and the measurement results prove they can effectively detect and diagnose the security attacks.


2019 ◽  
Vol 28 (04) ◽  
pp. 1950071
Author(s):  
Mona Safar ◽  
Magdy A. El-Moursy ◽  
Mohamed Abdelsalam ◽  
Ayman Bakr ◽  
Keroles Khalil ◽  
...  

An integrated framework for Virtual Verification and Validation (VVV) for a complete automotive system is proposed. The framework can simulate/emulate the system on three levels: System on Chip (SoC), Electronic control unit (ECU) and system level. The framework emulates the real system including hardware (HW) and software (SW). It enhances the automotive V-cycle and allows co-development of the automotive system SW and HW. The procedure for debugging AUTOSAR application on the virtual platform (VP) is shown. SW and HW profiling is feasible with the presented methodology. Verification and validation of automotive embedded SW is also presented. The proposed methodology is efficient as the system complexity increases which shortens the development cycle of automotive system. It also provides fault injection capability. With HW emulation, co-debugging mechanism is demonstrated. A case study covering the framework capability is presented. The case study demonstrates the proposed framework and methodology to design, simulate, trace, profile and debug AUTOSAR SW using VPs.


Author(s):  
Sho ENDO ◽  
Takeshi SUGAWARA ◽  
Naofumi HOMMA ◽  
Takafumi AOKI ◽  
Akashi SATOH

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