Current Conduction Model for Oxide-Based Resistive Random Access Memory Verified by Low-Frequency Noise Analysis

2013 ◽  
Vol 60 (3) ◽  
pp. 1272-1275 ◽  
Author(s):  
Z. Fang ◽  
H. Y. Yu ◽  
W. J. Fan ◽  
G. Ghibaudo ◽  
J. Buckley ◽  
...  
Keyword(s):  
Noise Analysis ◽  
Random Access ◽  
Low Frequency ◽  
Random Access Memory ◽  
Resistive Random Access Memory ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Access Memory ◽  
Conduction Model ◽  
Current Conduction

scholarly journals An improved multifilamentary conduction model for multiphysics analysis of reset process in resistive random access memory

AIP Advances ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 045310
Author(s):  
Hao Xie ◽  
Wenchao Chen ◽  
Shuo Zhang ◽  
Guodong Zhu ◽  
Afshan Khaliq ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Resistive Random Access Memory ◽  
Access Memory ◽  
Conduction Model
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