Quantitative Analysis on Resistance Fluctuation of Resistive Random Access Memory by Low Frequency Noise Measurement

2021 ◽  
pp. 1-1
Author(s):  
Tiancheng Gong ◽  
Danian Dong ◽  
Qing Luo ◽  
Xiaoxin Xu ◽  
Jianguo Yang ◽  
...  
2020 ◽  
Vol 12 (2) ◽  
pp. 02008-1-02008-4
Author(s):  
Pramod J. Patil ◽  
◽  
Namita A. Ahir ◽  
Suhas Yadav ◽  
Chetan C. Revadekar ◽  
...  

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