Characteristics of low frequency noise in n+Si-HfO2-Ni resistive random access memory
2013 ◽
Vol 60
(3)
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pp. 1272-1275
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2012 ◽
Vol 59
(3)
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pp. 850-853
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2020 ◽
Vol 8
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pp. 465-473
2010 ◽
Vol 31
(6)
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pp. 603-605
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2020 ◽
Vol 12
(2)
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pp. 02008-1-02008-4