Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics—Part I: Experimental
2019 ◽
Vol 66
(1)
◽
pp. 232-240
◽
Bianka Ullmann
◽
Markus Jech
◽
Katja Puschkarsky
◽
Gunnar Andreas Rott
◽
Michael Waltl
◽
...
T. J. J. Ho
◽
D. S. Ang
◽
C. M. Ng
B. Ullmann
◽
M. Jech
◽
S. Tyaginov
◽
M. Waltl
◽
Y. Illarionov
◽
...
2019 ◽
Vol 66
(1)
◽
pp. 241-248
◽
Markus Jech
◽
Bianka Ullmann
◽
Gerhard Rzepa
◽
Stanislav Tyaginov
◽
Alexander Grill
◽
...
2007 ◽
Vol 54
(7)
◽
pp. 1799-1803
◽
Chuan-Hsi Liu
◽
Tung-Ming Pan
C. Ma
◽
H. J. Mattausch
◽
M. Miyake
◽
T. Iizuka
◽
K. Matsuzawa
◽
...
2008 ◽
Vol 21
(8)
◽
pp. 687-694
2007 ◽
Vol 51
(2)
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pp. 268-277
◽
D.P. Ioannou
◽
D.E. Ioannou
2012 ◽
Vol 100
(8)
◽
pp. 083504
◽
Jong Tae Park
◽
Jin Young Kim
◽
Jean Pierre Colinge
Insaf Lahbib
◽
Mohamed Aziz Doukkali
◽
Patrick Martin
◽
Guy Imbert
J.R. Shih
◽
J.J. Wang
◽
W. Ken
◽
Yeng Peng
◽
J.T. Yue