Effect of Hot-Carrier Stress on the Recoverable and Permanent Components of Negative-Bias Temperature Instability

2010 ◽  
Author(s):  
T. J. J. Ho ◽  
D. S. Ang ◽  
C. M. Ng
Keyword(s):  
Negative Bias ◽  
Negative Bias Temperature Instability ◽  
Temperature Instability ◽  
Hot Carrier ◽  
Bias Temperature Instability ◽  
Hot Carrier Stress

scholarly journals Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics—Part I: Experimental

2019 ◽  
Vol 66 (1) ◽  
pp. 232-240 ◽  
Author(s):  
Bianka Ullmann ◽  
Markus Jech ◽  
Katja Puschkarsky ◽  
Gunnar Andreas Rott ◽  
Michael Waltl ◽  
...  
Keyword(s):  
Negative Bias ◽  
Negative Bias Temperature Instability ◽  
Temperature Instability ◽  
Hot Carrier ◽  
Bias Temperature Instability ◽  
Hot Carrier Stress

scholarly journals Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics—Part II: Theory

2019 ◽  
Vol 66 (1) ◽  
pp. 241-248 ◽  
Author(s):  
Markus Jech ◽  
Bianka Ullmann ◽  
Gerhard Rzepa ◽  
Stanislav Tyaginov ◽  
Alexander Grill ◽  
...  
Keyword(s):  
Negative Bias ◽  
Negative Bias Temperature Instability ◽  
Temperature Instability ◽  
Hot Carrier ◽  
Bias Temperature Instability ◽  
Hot Carrier Stress
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