Recovery Behavior of Interface Traps After Negative Bias Temperature Instability Stress in p-FinFETs Featuring Fast Trap Characterization Technique

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3099085 ◽

2021 ◽

pp. 1-8

Author(s):

Longda Zhou ◽

Qingzhu Zhang ◽

Hong Yang ◽

Zhigang Ji ◽

Guilei Wang ◽

...

Keyword(s):

Negative Bias ◽

Interface Traps ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Characterization Technique ◽

Recovery Behavior

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Universal recovery behavior of negative bias temperature instability [PMOSFETs]

IEEE International Electron Devices Meeting 2003 ◽

10.1109/iedm.2003.1269294 ◽

2004 ◽

Author(s):

S. Rangan ◽

N. Mielke ◽

E.C.C. Yeh

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Recovery Behavior

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Neutral interface traps for Negative Bias Temperature Instability

2011 International Reliability Physics Symposium ◽

10.1109/irps.2011.5784603 ◽

2011 ◽

Author(s):

Z. Chen ◽

X. Zhou ◽

Y. Z. Hu ◽

K. S. Machavolu

Keyword(s):

Negative Bias ◽

Interface Traps ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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Recovery behavior in negative bias temperature instability

Microelectronics Reliability ◽

10.1016/j.microrel.2013.12.021 ◽

2014 ◽

Vol 54 (3) ◽

pp. 520-528 ◽

Author(s):

Yoshiki Yonamoto

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Recovery Behavior

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Recovery behavior in negative bias temperature instability

2013 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2013.6532119 ◽

2013 ◽

Author(s):

Y. Yonamoto

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Recovery Behavior

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Effects of stress conditions on the generation of negative bias temperature instability-associated interface traps

Chinese Physics B ◽

10.1088/1674-1056/22/11/117311 ◽

2013 ◽

Vol 22 (11) ◽

pp. 117311 ◽

Author(s):

Yue Zhang ◽

Shi Pu ◽

Xiao-Yi Lei ◽

Qing Chen ◽

Xiao-Hua Ma ◽

...

Keyword(s):

Stress Conditions ◽

Negative Bias ◽

Interface Traps ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Effects Of Stress

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New Multi-stages – Hydrogen Diffusion Model for Negative Bias Temperature Instability

Journal of Nano- and Electronic Physics ◽

10.21272/jnep.11(4).04018 ◽

2019 ◽

Vol 11 (4) ◽

pp. 04018-1-04018-6

Author(s):

M. Mallati ◽

◽

H. Bentarzi ◽

Keyword(s):

Diffusion Model ◽

Hydrogen Diffusion ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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Defect Creation Stimulated by Thermally Activated Hole Trapping as the Driving Force Behind Negative Bias Temperature Instability in SiO2, SiON, and High-k Gate Stacks

2008 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2008.4796094 ◽

2008 ◽

Author(s):

Tibor Grasser ◽

Ben Kaczer ◽

Thomas Aichinger ◽

Wolfgang Goes ◽

Michael Nelhiebel

Keyword(s):

Driving Force ◽

Negative Bias ◽

Gate Stacks ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Thermally Activated ◽

Bias Temperature Instability ◽

Hole Trapping ◽

High K ◽

Defect Creation

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A novel Negative Bias Temperature Instability model for nanoscale Finfet

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2009.5232688 ◽

2009 ◽

Author(s):

Chenyue Ma ◽

Bo Li ◽

Frank He ◽

Xing Zhang ◽

Xinnan Lin

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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Spin dependent recombination study of the atomic-scale effects of fluorine on the negative bias temperature instability

2009 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2009.5173396 ◽

2009 ◽

Author(s):

J.T. Ryan ◽

P.M. Lenahan ◽

A.T. Krishnan ◽

S. Krishnan ◽

J.P. Campbell

Keyword(s):

Scale Effects ◽

Atomic Scale ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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Mechanism and process dependence of negative bias temperature instability (NBTI) for pMOSFETs with ultrathin gate dielectrics

International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) ◽

10.1109/iedm.2001.979649 ◽

2002 ◽

Author(s):

C.H. Liu ◽

M.T. Lee ◽

Chih-Yung Lin ◽

J. Chen ◽

K. Schruefer ◽

...

Keyword(s):

Gate Dielectrics ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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