Cantilever dynamics and energy localization during atomic force microscope infrared spectroscopy

2013 ◽  
Author(s):  
H. Cho ◽  
J. R. Felts ◽  
M.-F. Yu ◽  
L. A. Bergman ◽  
A. F. Vakakis ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Energy Localization ◽  
Atomic Force

The Effect of Polyester Structures on the Damping Property of Polyurethane Elastomers

2012 ◽  
Vol 581-582 ◽  
pp. 710-714
Author(s):  
Hao Chen ◽  
Hai Jun Zhou ◽  
De Ju Liu ◽  
Yan Tao Li
Keyword(s):  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Methyl Groups ◽  
Damping Properties ◽  
Step Method ◽  
Polyurethane Elastomers ◽  
Damping Property ◽  
Atomic Force ◽  
Tan Δ ◽  
Damping Materials

Polyurethane elastomers (PU) based on polyester, TDI-100 and MOCA were synthesized by two step method. The polyurethane elastomers were investigated by infrared spectroscopy (FTIR), atomic force microscope (AFM) and dynamic thermal mechanical analyses (DMA). The results show that the structure of polyester plays an important role in polyurethane damping materials. When the polyester contains more side methyl groups, the polyurethane material has high damping properties (tan δ) and wide damping zones. So the polyurethane damping property can be improved by choosing polyester with appropriate structure.

Near-field infrared absorption of plasmonic semiconductor microparticles studied using atomic force microscope infrared spectroscopy

2013 ◽  
Vol 102 (15) ◽  
pp. 152110 ◽  
Author(s):  
Jonathan R. Felts ◽  
Stephanie Law ◽  
Christopher M. Roberts ◽  
Viktor Podolskiy ◽  
Daniel M. Wasserman ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Infrared Absorption ◽  
Near Field ◽  
Atomic Force

Improved atomic force microscope infrared spectroscopy for rapid nanometer-scale chemical identification

2013 ◽  
Vol 24 (44) ◽  
pp. 444007 ◽  
Author(s):  
Hanna Cho ◽  
Jonathan R Felts ◽  
Min-Feng Yu ◽  
Lawrence A Bergman ◽  
Alexander F Vakakis ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Nanometer Scale ◽  
Chemical Identification ◽  
Atomic Force

Measuring individual carbon nanotubes and single graphene sheets using atomic force microscope infrared spectroscopy

2017 ◽  
Vol 28 (35) ◽  
pp. 355707 ◽  
Author(s):  
Matthew R Rosenberger ◽  
Michael Cai Wang ◽  
Xu Xie ◽  
John A Rogers ◽  
SungWoo Nam ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Graphene Sheets ◽  
Atomic Force

Nanoscale Structural Organization of Plant Epicuticular Wax Probed by Atomic Force Microscope Infrared Spectroscopy

2019 ◽  
Vol 91 (3) ◽  
pp. 2472-2479 ◽  
Author(s):  
Charles Farber ◽  
Rui Wang ◽  
Robert Chemelewski ◽  
John Mullet ◽  
Dmitry Kurouski
Keyword(s):  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Structural Organization ◽  
Epicuticular Wax ◽  
Atomic Force

Atomic force microscope infrared spectroscopy on 15 nm scale polymer nanostructures

2013 ◽  
Vol 84 (2) ◽  
pp. 023709 ◽  
Author(s):  
Jonathan R. Felts ◽  
Hanna Cho ◽  
Min-Feng Yu ◽  
Lawrence A. Bergman ◽  
Alexander F. Vakakis ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Polymer Nanostructures ◽  
Atomic Force

Infrared Spectroscopy with an Atomic Force Microscope

2000 ◽  
Vol 54 (3) ◽  
pp. 349-352 ◽  
Author(s):  
Mark S. Anderson
Keyword(s):  
Fourier Transform ◽  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Spectroscopic Analysis ◽  
Infrared Detector ◽  
Surface Layers ◽  
Separation Device ◽  
Surface Separation ◽  
Atomic Force ◽  
Ft Ir

An atomic force microscope (AFM) has been used to measure the modulated photothermal displacement of a surface, thus acting as a local detector. This was demonstrated with Fourier transform infrared (FT-IR) and filter spectrometers focused on various samples. Similarly, surface layers were removed by an AFM and analyzed by the photothermal deformation of the coated cantilever. This work shows that the AFM can function as both an infrared detector and a precise surface separation device for spectroscopic analysis. The AFM combined with an FT-IR has the potential to enhance the sensitivity, selectivity, and spatial resolution of infrared spectroscopy.

Recording IR spectra for individual electrospun fibers using an in situ AFM-synchrotron technique

2012 ◽  
Vol 1424 ◽  
Author(s):  
Urszula Stachewicz ◽  
Fei Hang ◽  
Russell J. Bailey ◽  
Himadri S. Gupta ◽  
Mark D. Frogley ◽  
...  
Keyword(s):  
Mechanical Property ◽  
Fourier Transform ◽  
Infrared Spectroscopy ◽  
Ir Spectra ◽  
Atomic Force Microscope ◽  
Structural Information ◽  
Electrospun Fibers ◽  
Atomic Force ◽  
Polyamide Fiber

AbstractA setup is described where an individual electrospun polyamide fiber is attached to an atomic force microscope (AFM) tip and structural information collected with synchrotron micro Fourier transform infrared spectroscopy (μFT-IR). The combination of AFM and synchrotron μFT-IR therefore highlights the potential for recording structure-mechanical property relationships simultaneously in materials with sub-micron dimensions.

scholarly journals Atomic Force Microscope Infrared Spectroscopy of Griseofulvin Nanocrystals

2013 ◽  
Vol 85 (23) ◽  
pp. 11449-11455 ◽  
Author(s):  
Aaron J. Harrison ◽  
Ecevit A. Bilgili ◽  
Stephen P. Beaudoin ◽  
Lynne S. Taylor
Keyword(s):  
Infrared Spectroscopy ◽  
Atomic Force Microscope ◽  
Atomic Force
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