Recording IR spectra for individual electrospun fibers using an in situ AFM-synchrotron technique
Keyword(s):
AbstractA setup is described where an individual electrospun polyamide fiber is attached to an atomic force microscope (AFM) tip and structural information collected with synchrotron micro Fourier transform infrared spectroscopy (μFT-IR). The combination of AFM and synchrotron μFT-IR therefore highlights the potential for recording structure-mechanical property relationships simultaneously in materials with sub-micron dimensions.
2016 ◽
2009 ◽
Vol 9
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pp. 1483-1486
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pp. 1061-1082
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pp. 1454-1457
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Vol 201
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pp. 413-421
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