Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors
1998 ◽
Vol 37
(Part 2, No. 4A)
◽
pp. L423-L425
◽
2009 ◽
Vol E92-C
(5)
◽
pp. 647-652
◽
2008 ◽
Keyword(s):
2017 ◽
Vol 26
(12)
◽
pp. 1750201