Investigation of TCO/p-interface and surface morphology of a-Si:H solar cells by in-situ ellipsometry

2002 ◽  
Author(s):  
H.N. Wanka ◽  
M.B. Schubert ◽  
E. Lotter
Keyword(s):  
Solar Cells ◽  
Surface Morphology

Growth of Epitaxial IrSi3 Layers on Si(111)

1989 ◽  
Vol 160 ◽  
Author(s):  
T. L. Lin ◽  
C. W. Nieh
Keyword(s):  
Surface Morphology ◽  
Molecular Beam ◽  
Solid Phase ◽  
Single Mode ◽  
Growth Conditions ◽  
Tem Analysis ◽  
Mbe Growth ◽  
Good Surface ◽  
Transmission Electron

AbstractEpitaxial IrSi3 films have been grown on Si (111) by molecular beam epitaxy (MBE) at temperatures ranging from 630 to 800 °C and by solid phase epitaxy (SPE) at 500 °C. Good surface morphology was observed for IrSi3 layers grown by MBE at temperatures below 680 °C, and an increasing tendency to form islands is noted in samples grown at higher temperatures. Transmission electron microscopy (TEM) analysis reveals that the IrSi3 layers grow epitaxially on Si(111) with three epitaxial modes depending on the growth conditions. For IrSi3 layers grown by MBE at 630 °C, two epitaxial modes were observed with ~ 50% area coverage for each mode. Single mode epitaxial growth was achieved at a higher MBE growth temperature, but with island formation in the IrSi3 layer. A template technique was used with MBE to improve the IrSi3 surface morphology at higher growth temperatures. Furthermore, single-crystal IrSi3 was grown on Si(111) at 500 °C by SPE, with annealing performed in-situ in a TEM chamber.

scholarly journals Extracting in Situ Charge Carrier Diffusion Parameters in Perovskite Solar Cells with Light Modulated Techniques

2021 ◽  
pp. 2248-2255
Author(s):  
Agustín Bou ◽  
Haralds A̅boliņš ◽  
Arjun Ashoka ◽  
Héctor Cruanyes ◽  
Antonio Guerrero ◽  
...  
Keyword(s):  
Solar Cells ◽  
Charge Carrier ◽  
Perovskite Solar Cells ◽  
Carrier Diffusion ◽  
Diffusion Parameters ◽  
Charge Carrier Diffusion

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

scholarly journals An in situ spectroscopic erosion yield measurement with applications to sputtering and surface morphology alterations

1989 ◽  
Vol 7 (1) ◽  
pp. 21-26 ◽  
Author(s):  
W. K. Leung ◽  
Y. Hirooka ◽  
R. W. Conn ◽  
D. M. Goebel ◽  
B. Labombard ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Yield Measurement

In-situ investigation of the bulk heterojunction formation processes in the active layers of organic solar cells

2015 ◽  
Vol 10 (7-8) ◽  
pp. 600-605 ◽  
Author(s):  
K. Kvamen ◽  
S. Grigoryan ◽  
D. V. Anokhin ◽  
V. A. Bataev ◽  
A. I. Smirnov ◽  
...  
Keyword(s):  
Solar Cells ◽  
Organic Solar Cells ◽  
Bulk Heterojunction ◽  
Formation Processes ◽  
Active Layers ◽  
In Situ Investigation

In Situ TEM Analysis of Organic–Inorganic Metal-Halide Perovskite Solar Cells under Electrical Bias

Nano Letters ◽  
2016 ◽  
Vol 16 (11) ◽  
pp. 7013-7018 ◽  
Author(s):  
Quentin Jeangros ◽  
Martial Duchamp ◽  
Jérémie Werner ◽  
Maximilian Kruth ◽  
Rafal E. Dunin-Borkowski ◽  
...  
Keyword(s):  
Solar Cells ◽  
Perovskite Solar Cells ◽  
Metal Halide ◽  
In Situ Tem ◽  
Tem Analysis ◽  
Metal Halide Perovskite ◽  
Halide Perovskite ◽  
Electrical Bias
Sign in / Sign up

Export Citation Format

Share Document