Design and manufacture of high precision strain gauge dynamometers and balances at the O.N.E.R.A. Modane Centre

Strain ◽  
1974 ◽  
Vol 10 (4) ◽  
pp. 188-194 ◽  
Author(s):  
M. DUBOIS
ACTA IMEKO ◽  
2020 ◽  
Vol 9 (5) ◽  
pp. 210
Author(s):  
Marco M. Schäck

For high-precision measurements of strain gauge-based transducers, 225 Hz carrier frequency measuring amplifiers are primarily used. The benefits of this carrier frequency method were discussed in previous publications. This publication shows the measurement uncertainty that can be achieved by calibrating an amplifier based on this method. Possibilities for improving the measurement uncertainty and the physical limit from the user's point of view are shown.


ACTA IMEKO ◽  
2017 ◽  
Vol 6 (4) ◽  
pp. 31 ◽  
Author(s):  
André W. Schäfer

<p class="Abstract"><span lang="EN">In cases where accuracy matters, and in metrology of mechanical quantities such as force, torque or pressure this is definitely the case, are almost exclusively realized by transducers, which are based on strain gauges. To exploit the potential of the widely used high-precision static measurements the demands on </span><span lang="EN-GB">precision amplifiers steadily grow. This paper gives exact details to further progress of the precision amplifiers used and how compact they can be realized nowadays.</span></p>


2020 ◽  
Vol 982 ◽  
pp. 151-156
Author(s):  
Xun Qiao ◽  
Xu Feng Bai ◽  
Yi Zhang ◽  
Dong Rong Meng

This paper mainly investigated the revolution of residual stresses and dimension stability in high-precision components during thermal-mechanical processes. Especially, originate of residual stress and its influences on dimension stability, from each step of the design and manufacture processes to thermal-mechanical processes, as well as their complicated interactions were elucidated in detail. Finally, the recent progress of modern analytical and computational techniques were discussed to provide possibilities to quantitative predict and control residual stresses and dimensional stabilities in high-precision components.


1969 ◽  
Vol 23 (2) ◽  
pp. 157-159 ◽  
Author(s):  
J. V. Fox ◽  
H. W. Prengle

An externally mounted high pressure semiconductor strain gauge transducer of high precision is described which was used in connection with liquid ir absorption and PVT measurements up to 10 000 atm pressure. The transducer is nonlinear, but can be calibrated by a three point procedure, one point of which is the freezing point of mercury at 0°C, and fit to a derived mathematical function. The precision of the device is approximately 0.8 atm, with a repeatability of 5.5 parts in 10 000, at a level of 10 000 atm.


2019 ◽  
Vol 14 (2) ◽  
Author(s):  
Muchamad Gozali ◽  
Yudi Irawadi

An XY-T Recorder is a measuring equipment that function to record data of statical-testing result and it is shown in the form of graphs. The graphs of appearance indicate actual-condition of output censor such as Loadcell (Force),LVDT(deflection), Strain gauge (Strains) or Pressure. Design and manufacture of XY-T Recorder based in this digital is intended to satisfy the limit of XY-T Recorder analog available in B2TKS. The result of calibration shows certain calibration of 0.13% at the level trust of 95% with the factor k=2 and it indicates the accuracy to be fairly good.The result of experiment has displayed output of graphs with pattern and value magnitudes of relatively equal to the XY-TRecorder analogKeywords : XY-T Recorder digital, statical-testing, XY-T Recorder analog, CalibrationAbstrak XY-T Recorder adalah suatu alat ukur yang berfungsi untuk merekam data hasil uji statis yang ditampilkan dalam bentuk grafik. Grafik yang ditampilkan menunjukkan kondisi aktual dari besaran yang keluar dari sensor seperti loadcell (gaya), LVDT (defleksi), strain gauge (regangan) ataupun pressure (tekanan).Perancangan dan pembuatan XY-T Recorder berbasis digital ini bertujuan untuk memenuhi keterbatasan XY-T Recorder analog yang dimiliki oleh B2TKS. Dari hasil kalibrasi menunjukkan ketidakpastian kalibrasi 0,13% pada tingkat kepercayaan 95% dengan faktor k=2, hal ini menunjukkan ketelitian yang cukup bagus, dan dari hasil uji coba pada saat pengujian menunjukkan keluaran grafik dengan pola dan nilai besaran yang relatip sama dengan XY-T Recorder analog.Kata Kunci : XY-T Recorder digital, Uji Statis, XY-T Recorder analog,Kalibrasi


Author(s):  
John A. Williams

Micro-System Technology, which encompasses micro-electro-mechanical systems or MEMS, is a rapidly growing interdisciplinary technology dealing with the design and manufacture of miniaturised machines with major dimensions at the scale of tens, to perhaps hundreds, of microns. Because they depend on the cube of a representative dimension, component masses and inertias rapidly become small as size decreases whereas surface and tribological effects, which often depend on area, become increasingly important. Although our explanations of macroscopic tribological phenomena often involve individual events occurring at the micro-scale, when the overall component or device size is itself miniaturised it may be necessary to re-evaluate some conventional tribological solutions. While absolute loads are small in such micro-devices, tribological requirements, especially in terms of device longevity, which may be limited by wear rather than friction, are demanding and will need imaginative and novel solutions. Not only is the available material set limited by the fabrication process but, in addition, the resulting components which have small linear dimensions are not, by conventional standards, of high precision and this too can impact on their tribological behaviour.


2008 ◽  
Vol 8 (2) ◽  
Author(s):  
Friedrich Lackner ◽  
Werner Riegler ◽  
P. Osanna ◽  
M. Durakbasa
Keyword(s):  

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