Analysis of liquid suspensions using scanning electron microscopy in transmission: estimation of the water film thickness using Monte-Carlo simulations

Monte Carlo ◽

Film Thickness ◽

Monte Carlo Simulations ◽

Water Film ◽

Water Film Thickness ◽

Liquid Suspensions ◽

Transmission Estimation ◽

Monte Carlo method in scanning electron microscopy. 1. Modeling and experiment

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s1027451017040243 ◽

2017 ◽

Vol 11 (4) ◽

pp. 853-864 ◽

Cited By ~ 6

Author(s):

Yu. A. Novikov

Keyword(s):

Electron Microscopy ◽

Monte Carlo ◽

Monte Carlo Method ◽

Application of Monte Carlo Simulation Method to the Nano-Scale Characterization by Scanning Electron Microscopy

Materials Science Forum - PRICM-5 ◽

10.4028/0-87849-960-1.4161 ◽

2005 ◽

pp. 4161-4164

Author(s):

Z.J. Ding ◽

H.M. Li ◽

X. Sun

Keyword(s):

Electron Microscopy ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Simulation Method ◽

Monte Carlo Simulation Method ◽

Nano Scale ◽

Scale Characterization ◽

Monte Carlo modelling of the low-loss electron signal in scanning electron microscopy and comparison with the BSE signal

Journal of Physics Conference Series ◽

10.1088/1742-6596/209/1/012070 ◽

2010 ◽

Vol 209 ◽

pp. 012070 ◽

Cited By ~ 1

Author(s):

C Bonet ◽

M M El-Gomati ◽

J A D Matthew ◽

S P Tear

Keyword(s):

Electron Microscopy ◽

Monte Carlo ◽

Low Loss ◽

Surface roughness of preparations for backscattered electron-scanning electron microscopy: The image differences and their monte carlo simulation

Scanning ◽

10.1002/sca.4950210601 ◽

2006 ◽

Vol 21 (6) ◽

pp. 361-367 ◽

Cited By ~ 7

Author(s):

P. G. T. Howell ◽

A. Boyde

Keyword(s):

Electron Microscopy ◽

Surface Roughness ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Backscattered Electron ◽

Monte Carlo simulation of scanning electron microscopy bright contrast images of suspended carbon nanofibers

Applied Physics Letters ◽

10.1063/1.2450655 ◽

2007 ◽

Vol 90 (8) ◽

pp. 083111 ◽

Cited By ~ 20

Author(s):

Makoto Suzuki ◽

Toshishige Yamada ◽

Cary Y. Yang

Keyword(s):

Electron Microscopy ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Carbon Nanofibers ◽

Bright Contrast ◽

Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948834 ◽

2014 ◽

Cited By ~ 1

Author(s):

M. Ciappa ◽

E. Ilgunsatiroglu ◽

A. Yu. Illarionov ◽

F. Filosomi ◽

C. Santini

Keyword(s):

Electron Microscopy ◽

Monte Carlo ◽

Critical Dimension ◽

Nanometer Scale ◽

Roughness Parameters ◽

Monte Carlo Modeling ◽

Characterization of Liquid Suspensions in 3D using Environmental Scanning Electron Microscopy in Transmission

Microscopy and Microanalysis ◽

10.1017/s1431927618002246 ◽

2018 ◽

Vol 24 (S1) ◽

pp. 350-351

Author(s):

Juan Xiao ◽

Lucian Roiban ◽

Genevieve Foray ◽

Karine Masenelli-Varlot

Keyword(s):

Electron Microscopy ◽

Environmental Scanning Electron Microscopy ◽

Environmental Scanning ◽

Liquid Suspensions ◽

The effect of gaseous and liquid water layers on the estimation of the composition of materials in High Pressure Scanning Electron Microscopy (HPSEM): A Monte Carlo Simulation

Electron Microscopy and Analysis 1997 ◽

10.1201/9781003063056-63 ◽

2022 ◽

pp. 245-248

Author(s):

H R Powell ◽

K J Hollis ◽

J S Shah

Keyword(s):

Electron Microscopy ◽

Monte Carlo Simulation ◽

High Pressure ◽

Monte Carlo ◽

Liquid Water ◽

Water Layers ◽

The Validation of Monte Carlo Methods for Scanning Electron Microscopy and Electron Microprobe Analysis

Microscopy and Microanalysis ◽

10.1017/s1431927605506792 ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

E Lifshin ◽

B Thiel ◽

R Gauvin

Keyword(s):

Electron Microscopy ◽

Monte Carlo ◽

Electron Microprobe ◽

Monte Carlo Methods ◽

Microprobe Analysis ◽

Electron Microprobe Analysis ◽

Unstructured tetrahedric meshes for the description of complex three-dimensional sample geometries in Monte Carlo simulation of scanning electron microscopy images for metrology applications

Microelectronics Reliability ◽

10.1016/j.microrel.2013.07.131 ◽

2013 ◽

Vol 53 (9-11) ◽

pp. 1381-1386 ◽

Cited By ~ 4

Author(s):

Emre Ilgünsatiroglu ◽

Alexey Yu. Illarionov ◽

Mauro Ciappa

Keyword(s):

Electron Microscopy ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Three Dimensional ◽

Microscopy Images ◽