INVESTIGATION OF TORSIONAL DEFLECTION AS AN UNDESIRED MOTION IN ATOMIC FORCE MICROSCOPY WITH SIDEWALL PROBE

2015 ◽  
Vol 76 (1) ◽  
Author(s):  
Farzad Mokhtarinezhad ◽  
Roslan Abd. Rahman ◽  
Sina Eftekhar ◽  
Sedigheh Sadegh Hassani
Keyword(s):  
Atomic Force Microscopy ◽  
Side Wall ◽  
Vertical Motion ◽  
Interaction Force ◽  
Occurrence Probability ◽  
Force Microscopy ◽  
Atomic Force ◽  
Couple Motion ◽  
Micro Cantilever ◽  
Extension Length

In this paper an analytical model is presented for the Micro-Cantilever (MC) of Atomic Force Microscopy with Side Wall probe (AFM-SW) in the tapping excitation mode. In this model the couple motion of the MC is taken into account while the torsional motion is considered as an undesirable motion which is coupled with the vertical motion. To this end, the effect of several parameters, namely; probe mass, probe dislocation, sidewall extension length, and tip sample interaction force is investigated on the occurrence probability of torsional and vertical motions. It is found that the probe dislocation is the prerequisite factor of the undesired motion happening. For sake of validation, the analytical results are compared against the previously published results, and an excellent agreement is observed.

scholarly journals High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

2017 ◽  
Vol 8 ◽  
pp. 1563-1570 ◽  
Author(s):  
Juan Ren ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Interaction Force ◽  
Dynamic Mode ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mode Tm ◽  
Mode Atomic Force Microscopy

Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.

scholarly journals PROBING ATOMIC LEVEL INTERACTIONS IN NI NANORODS AND AFM CANTILEVER USING ATOMIC FORCE MICROSCOPY BASED F–D SPECTROSCOPY

2017 ◽  
Author(s):  
Sudipta Dutta ◽  
Mahesh Kumar Singh ◽  
M. S. Bobji
Keyword(s):  
Atomic Force Microscopy ◽  
Magnetic Interaction ◽  
Interaction Force ◽  
Small Scale ◽  
Magnetic Composite ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lift Height ◽  
Afm Cantilever ◽  
Force Displacement

Atomic force microscopy based force-displacement spectroscopy is used to quantify magnetic interaction force between sample and magnetic cantilever. AFM based F–D spectroscopy is used widely to understand various surface-surface interaction at small scale. Here we have studied the interaction between a magnetic nanocomposite and AFM cantilevers. Two different AFM cantilever with same stiffness but with and without magnetic coating is used to obtain F–D spectra in AFM. The composite used has magnetic Ni nanophase distributed uniformly in an Alumina matrix. Retrace curves obtained using both the cantilevers on magnetic composite and sapphire substrate are compared. It is found for magnetic sample cantilever comes out of contact after traveling 100 nm distance from the actual point of contact. We have also used MFM imaging at various lift height and found that beyond 100nm lift height magnetic contrast is lost for our composite sample, which further confirms our F–D observation.

Study on measurement interaction force on living cell by atomic force microscopy

2005 ◽  
Author(s):  
Yanxia Wang ◽  
Yanning Li ◽  
Xing Fu ◽  
Jun-Yong Cui ◽  
Xiaotang Hu
Keyword(s):  
Atomic Force Microscopy ◽  
Living Cell ◽  
Interaction Force ◽  
Force Microscopy ◽  
Atomic Force

Estimation of Molecular Interaction Force Using Atomic Force Microscopy for Bioapplication

2016 ◽  
Vol 120 (42) ◽  
pp. 10932-10935 ◽  
Author(s):  
Hweiyan Tsai ◽  
Zihkai Chen ◽  
Huiwen Deng ◽  
Sinmei Tsai ◽  
C. Bor Fuh
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Interaction ◽  
Interaction Force ◽  
Force Microscopy ◽  
Atomic Force
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