scholarly journals PROBING ATOMIC LEVEL INTERACTIONS IN NI NANORODS AND AFM CANTILEVER USING ATOMIC FORCE MICROSCOPY BASED F–D SPECTROSCOPY

2017 ◽  
Author(s):  
Sudipta Dutta ◽  
Mahesh Kumar Singh ◽  
M. S. Bobji
Keyword(s):  
Atomic Force Microscopy ◽  
Magnetic Interaction ◽  
Interaction Force ◽  
Small Scale ◽  
Magnetic Composite ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lift Height ◽  
Afm Cantilever ◽  
Force Displacement

Atomic force microscopy based force-displacement spectroscopy is used to quantify magnetic interaction force between sample and magnetic cantilever. AFM based F–D spectroscopy is used widely to understand various surface-surface interaction at small scale. Here we have studied the interaction between a magnetic nanocomposite and AFM cantilevers. Two different AFM cantilever with same stiffness but with and without magnetic coating is used to obtain F–D spectra in AFM. The composite used has magnetic Ni nanophase distributed uniformly in an Alumina matrix. Retrace curves obtained using both the cantilevers on magnetic composite and sapphire substrate are compared. It is found for magnetic sample cantilever comes out of contact after traveling 100 nm distance from the actual point of contact. We have also used MFM imaging at various lift height and found that beyond 100nm lift height magnetic contrast is lost for our composite sample, which further confirms our F–D observation.

A Systematic Method for Developing Harmonic Cantilevers for Atomic Force Microscopy

2016 ◽  
Vol 139 (1) ◽  
Author(s):  
Benliang Zhu ◽  
Soren Zimmermann ◽  
Xianmin Zhang ◽  
Sergej Fatikow
Keyword(s):  
Atomic Force Microscopy ◽  
Focused Ion Beam ◽  
Natural Frequencies ◽  
Ion Beam ◽  
Interaction Force ◽  
Resonant Frequencies ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Afm Cantilever

This paper proposes a method for developing harmonic cantilevers for tapping mode atomic force microscopy (AFM). The natural frequencies of an AFM cantilever are tuned by inserting gridiron holes with specific sizes and locations, such that the higher order resonance frequencies can be assigned to be integer harmonics generated by the nonlinear tip–sample interaction force. The cantilever is modeled using the vibration theory of the Timoshenko beam with a nonuniform cross section. The designed cantilever is fabricated by modifying a commercial cantilever through focused ion beam (FIB) milling. The resonant frequencies of the designed cantilever are verified using a commercial AFM.

scholarly journals High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

2017 ◽  
Vol 8 ◽  
pp. 1563-1570 ◽  
Author(s):  
Juan Ren ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Interaction Force ◽  
Dynamic Mode ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mode Tm ◽  
Mode Atomic Force Microscopy

Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.

Force Measurement by AFM Cantilever with Different Coating Layers

2006 ◽  
Vol 326-328 ◽  
pp. 377-380 ◽  
Author(s):  
Meng Kao Yeh ◽  
Bo Yi Chen ◽  
Nyan Hwa Tai ◽  
Chien Chao Chiu
Keyword(s):  
Force Measurement ◽  
Force Measurements ◽  
The Finite Element Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nonlinear Force ◽  
Coating Layers ◽  
Afm Cantilever ◽  
Force Displacement ◽  
Spring Constants

Atomic force microscopy (AFM) is widely used in many fields, because of its outstanding force measurement ability in nano scale. Some coating layers are used to enhance the signal intensity, but these coating layers affect the spring constant of AFM cantilever and the accuracy of force measurement. In this paper, the spring constants of rectangular cantilever with different coating thickness were quantitatively measured and discussed. The finite element method was used to analyze the nonlinear force-displacement behavior from which the cantilever’s normal and torsional spring constants could be determined. The experimental data and the numerical results were also compared with the results from other methods. By considering the influence of coating layers and real cantilever geometries, the more accurate force measurements by AFM cantilever can be obtained.

Study on measurement interaction force on living cell by atomic force microscopy

2005 ◽  
Author(s):  
Yanxia Wang ◽  
Yanning Li ◽  
Xing Fu ◽  
Jun-Yong Cui ◽  
Xiaotang Hu
Keyword(s):  
Atomic Force Microscopy ◽  
Living Cell ◽  
Interaction Force ◽  
Force Microscopy ◽  
Atomic Force

Fundamental frequencies of a nano beam used for atomic force microscopy (AFM) in tapping mode

MRS Advances ◽  
2018 ◽  
Vol 3 (42-43) ◽  
pp. 2617-2626 ◽  
Author(s):  
MALESELA K. MOUTLANA ◽  
SARP ADALI
Keyword(s):  
Atomic Force Microscopy ◽  
Degree Of Freedom ◽  
Small Scale ◽  
Single Degree Of Freedom ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Single Degree ◽  
Nano Scale ◽  
Atomic Force ◽  
Tip Mass

ABSTRACTIn this study we investigate the motion of a torsionally restrained beam used in tapping mode atomic force microscopy (TM-AFM), with the aim of manufacturing at nano-scale. TM-AFM oscillates at high frequency in order to remove material or shape nano structures. Euler-Bernoulli theory and Eringen’s theory of non-local continuum are used to model the nano machining structure composed of two single degree of freedom systems. Eringen’s theory is effective at nano-scale and takes into account small-scale effects. This theory has been shown to yield reliable results when compared to modelling using molecular dynamics.The system is modelled as a beam with a torsional boundary condition at one end; and at the free end is a transverse linear spring attached to the tip. The other end of the spring is attached to a mass, resulting in a single degree of freedom spring-mass system. The motion of the tip of the beam and tip mass can be investigated to observe the tip frequency response, displacement and contact force. The beam and spring–mass frequencies contain information about the maximum displacement amplitude and therefore the sample penetration depth and this allows

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