DESIGN OF NON DESTRUCTIVE TESTING ON COMPOSITE MATERIAL USING PARALLEL PLATE ELECTRICAL CAPACITANCE TOMOGRAPHY: A CONCEPTUAL FRAMEWORK

2017 ◽  
Vol 79 (5-2) ◽  
Author(s):  
Wan Norhisyam Abd Rashid ◽  
Elmy Johana Mohamad ◽  
Ruzairi Abdul Rahim ◽  
A Shamsul Rahimi Subki ◽  
Abdul Latiff Ahood ◽  
...  

In this paper, a conceptual framework for a non destructive testing to check defect on composite material using parallel plate electrical capacitance tomography is being proposed. At the early stage, the possibility of using this method is being simulated using Comsol Multiphysic software. The simulation process has shown promising results to make this concept works. When a dielectric material is placed between the parallel plates, the permittivity distribution can be observed. As the number of electrodes of the sensor are increased from 2 to 8 electrodes, the capacitance value increase from 2.0131e-11-2.3532e-14i F to 5.2474e-11-3.0756e-13i F. Furthermore, there are significant results when the size and the permittivity of the object are varies. 

Author(s):  
N. Lokmanulhakim ◽  
W .N. Abd Rashid ◽  
N. H. Hussin ◽  
M. F. Mukhtar

Gold is the yellow precious metal that has been used in many applications likes medicine, electronics, jewelry, investment and others. Thus, gold is one of the commodities which has high demand in the global market. In other to secure the purity of gold and to protect the retailer and consumer from fraud, the detection of gold is very important in the industry. There are many techniques have been used to detect the purity of gold material and those techniques must consider a several factors such as non-destructive, inexpensive, precise, simple and widely accepted by the jewelry industries. Electrical capacitance tomography (ECT) is the most mature non-destructive technique among various tomography. The advantages of ECT are non-radioactive, non-intrusive, high imaging speed and low cost. This paper introduces the ECT using the square sensor. The aim of his paper this to present a new method of verifying the conductive materials using a parallel plate sensor which adopted from the ECT system.


2013 ◽  
Vol 64 (2) ◽  
pp. 21001 ◽  
Author(s):  
Jean-Luc Bodnar ◽  
Jean-Jacques Metayer ◽  
Kamel Mouhoubi ◽  
Vincent Detalle

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