Design and Reliability in Electronic Packaging Including Power Temperature Cycling and Vibration Effects

Author(s):  
Mark D. Nickerson ◽  
Chandrakant S. Desai

Thermomechanical, power temperature cycling (PTC) and vibration analyses were performed on a 313 staggered pin PBGA package using plastic and viscoplastic disturbed-state damage models. An accelerated finite element failure analysis was performed using a newly developed procedure. Validations were performed using published PBGA test data. The disturbed state concept was used to model the disturbance (damage) accumulated in PBGA solder joints subjected to thermal cycling (PTC and TCT), vibration, and vibration coupled with three distinct temperatures. 2D FEA plastic and viscoplastic models were created based on a diagonal “slice” of the PBGA. This allowed the most critical solder balls (under the die and furthest DNP) to be analyzed in the same model. The thermal cycling results indicate that the solder balls under the die are the most likely to fail. The vibration results indicate the solder balls furthest from the package center are most likely to fail. The vibration results, coupled with distinct isothermal temperatures, indicate that as temperature increases, the cycles to failure decreases.

2016 ◽  
Vol 2016 (1) ◽  
pp. 000123-000133
Author(s):  
Thomas F. Marinis ◽  
Joseph W. Soucy

Abstract Solder coated polymer balls have been successfully employed for attaching packages to circuit boards with minimum standoff height, while accommodating large mismatches in thermal expansion coefficients. Dramatic improvements in temperature cycling performance are often realized by using them in place of solid solder balls, with five-fold increases in mean cycles to failure reported by a number of investigators. The sales literature, provided by suppliers of solder coated solder balls, attribute this superior temperature cycling performance to the soft, compliant polymer core of the product. Our study of the mechanics of solder coated polymer balls has revealed that their stiffness is in fact comparable to that of solid solder balls. Their rigidity results from a composite construction in which a nearly incompressible polymer material is surrounded by a copper shell that is not easily deformed from its spherical shape. We have employed finite element analysis and mechanical measurements to obtain load versus deflection curves for both normal compression and shear displacements of solder coated polymer ball connections. The enhanced temperature cycling performance of solder coated polymer ball connections is also derived from their composite construction. A cross-section through one reveals that near the solder pads, the ratio of copper to polymer is quite high, and consequently so is its resistance to shear. At the mid-plane of the connection, the ratio of copper to polymer is low, which minimizes its shear resistance. Thus, when a solder coated polymer ball connection is subjected to a shear load, as in temperature cycling, most of its deformation occurs around its mid-section. By contrast, when a solid solder ball is subjected to a shear load, most of its deformation occurs near its attachment pads, where its cross-sectional area and hence its stiffness are minimal. In either type of attachment, failure occurs when sufficient plastic strain damage accumulates in the solder to initiate a fracture. By distributing its shear strain over its midsection, a solder coated polymer ball minimizes plastic strain in its solder, where as a solder ball concentrates it near its bond pads. We have used finite element analysis to compute the cumulative plastic strain in various solder coated polymer ball assemblies subjected to cyclic shear loading induced by thermal excursions. By combining these results with an Engelmaier solder fatigue model, we predicted mean number of temperature cycles to failure of the solder connections. Our results compare favorably with published experimental data from temperature cycle tests. We have employed this analysis technique to examine how fatigue life is impacted by various connection parameters such as package size, stand-off height and solder composition, as well as those specific to solder coated polymer balls, which include size and mechanical properties of the core and ratios of solder and copper thicknesses to core diameter. Our overall objective is to enable design of complex stacked assemblies of multichip modules that meet customer reliability requirements for various use environments.


Author(s):  
Russell D. Whitenack ◽  
Chandra S. Desai

The disturbed state concept (DSC) presented herein represents a unified and powerful approach for constitutive modeling of materials and interfaces in electronic packaging. Together with the computer finite element procedure it provides an analysis tool for calculation of stresses, strains, disturbance and cycles to failure. The accelerated procedure allows economical approximation of cycles to failure and distribution of disturbance at different cycles for design and reliability.


2000 ◽  
Vol 122 (4) ◽  
pp. 335-340 ◽  
Author(s):  
Reza Ghaffarian

This paper reviews the accelerated thermal cycling test methods that are currently used by industry to characterize the interconnect reliability of commercial-off-the-shelf (COTS) ball grid array (BGA) and chip scale package (CSP) assemblies. Acceleration induced failure mechanisms varied from conventional surface mount (SM) failures for CSPs. Examples of unrealistic life projections for other CSPs are also presented. The cumulative cycles-to-failure for ceramic BGA assemblies performed under different conditions, including plots of their two Weibull parameters, are presented. The results are for cycles in the range of −30°C to 100°C, −55°C to 100°C, and −55°C to 125°C. Failure mechanisms, as well as cycles to failure for thermal shock and thermal cycling conditions in the range of −55°C to 125°C, were compared. Projection to other temperature cycling ranges using a modified Coffin-Manson relationship is also presented. [S1043-7398(00)00104-3]


1991 ◽  
Vol 41 (5) ◽  
pp. 1087-1093 ◽  
Author(s):  
S.M.R. Adluri ◽  
M.K.S. Madugula ◽  
G.R. Monforton

2002 ◽  
Vol 24 (2) ◽  
pp. 151-162 ◽  
Author(s):  
Ha-Won Song ◽  
Dong-Woo You ◽  
Keun-Joo Byun ◽  
Koichi Maekawa

2000 ◽  
Vol 123 (2) ◽  
pp. 147-155 ◽  
Author(s):  
Krishna Darbha ◽  
Abhijit Dasgupta

The nested finite element methodology (NFEM) presented in Part I of this series, is used in this paper to analyze the viscoplastic stress-state in a flip-chip-on-board (FCOB) and a chip scale package subjected to temperature cycling loads. The results are validated with conventional finite element method (CFEM). An energy-partitioning (EP) damage model is used to predict cycles to failure, based on the energy densities obtained from NFEM and CFEM, and results are compared with experiments.


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