Secondary-ion-mass spectrometry and high-resolution x-ray diffraction analyses of GaSb–AlGaSb heterostructures grown by molecular beam epitaxy

X Ray Diffraction ◽

X Ray ◽

Ion Mass Spectrometry ◽

Corrigendum to’ X-ray diffraction and secondary ion mass spectrometry investigations of GaN films grown on (0 0 1) and (1 1 0) MgF2 substrates by plasma-assisted molecular beam epitaxy (PA-MBE)’. Materials science in semiconductor processing 119 (2020) 105,262

Materials Science in Semiconductor Processing ◽

10.1016/j.mssp.2020.105544 ◽

2021 ◽

Vol 122 ◽

pp. 105544

Author(s):

Kevin Meyer ◽

Martin Buchholz ◽

Daniel Uxa ◽

Lars Dörrer ◽

Harald Schmidt ◽

...

Keyword(s):

Mass Spectrometry ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Materials Science ◽

X Ray Diffraction ◽

Semiconductor Processing ◽

X Ray ◽

Ion Mass Spectrometry ◽

X-ray diffraction and secondary ion mass spectrometry investigations of GaN films grown on (0 0 1) and (1 1 0) MgF2 substrates by plasma-assisted molecular beam epitaxy (PA-MBE)

Materials Science in Semiconductor Processing ◽

10.1016/j.mssp.2020.105262 ◽

2020 ◽

Vol 119 ◽

pp. 105262

Author(s):

Kevin Meyer ◽

Martin Buchholz ◽

Daniel Uxa ◽

Lars Dörrer ◽

Harald Schmidt ◽

...

Keyword(s):

Mass Spectrometry ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

X Ray Diffraction ◽

X Ray ◽

Ion Mass Spectrometry ◽

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

Aluminas modified with silica. Part 1.—An X-ray diffraction and secondary-ion mass-spectrometry study of the influence of preparation and thermal treatment on structure and surface composition

10.1039/f19848001903 ◽

1984 ◽

Vol 80 (7) ◽

pp. 1903 ◽

Cited By ~ 9

Author(s):

Alan W. Espie ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Thermal Treatment ◽

Surface Composition ◽

X Ray Diffraction ◽

X Ray ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

Journal of Cereal Science ◽

10.1016/j.jcs.2013.12.006 ◽

2014 ◽

Vol 59 (2) ◽

pp. 173-180 ◽

Cited By ~ 50

Author(s):

Bianca Kyriacou ◽

Katie L. Moore ◽

David Paterson ◽

Martin D. de Jonge ◽

Daryl L. Howard ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Fluorescence Microscopy ◽

Rice Grain ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary‐ion mass spectrometry on δ‐doped GaAs grown by molecular beam epitaxy

Applied Physics Letters ◽

10.1063/1.104026 ◽

1990 ◽

Vol 57 (17) ◽

pp. 1799-1801 ◽

Cited By ~ 28

Author(s):

E. F. Schubert ◽

H. S. Luftman ◽

R. F. Kopf ◽

R. L. Headrick ◽

J. M. Kuo

Keyword(s):

Mass Spectrometry ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Ion Mass Spectrometry ◽

Sn incorporation into InP grown by molecular beam epitaxy: A secondary‐ion mass spectrometry study

Applied Physics Letters ◽

10.1063/1.102947 ◽

1990 ◽

Vol 56 (23) ◽

pp. 2301-2303 ◽

Cited By ~ 14

Author(s):

M. B. Panish ◽

R. A. Hamm ◽

L. C. Hopkins

Keyword(s):

Mass Spectrometry ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Investigation of the Surface Chemical Structure of Some Biomedical Poly(amidoamine)s Using High-Resolution X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Macromolecules ◽

10.1021/ma00128a041 ◽

1995 ◽

Vol 28 (24) ◽

pp. 8259-8271 ◽

Cited By ~ 10

Author(s):

A. G. Shard ◽

L. Sartore ◽

M. C. Davies ◽

P. Ferruti ◽

A. J. Paul ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Photoelectron Spectroscopy ◽

Chemical Structure ◽

Time Of Flight ◽

Surface Chemical ◽

X Ray ◽

Ion Mass Spectrometry ◽

A study of the distribution of hydrogen and strain in proton-bombarded liquid-encapsulated Czochralski-grown GaAs by double-crystal x-ray diffraction and secondary ion mass spectrometry

Materials Science and Engineering B ◽

10.1016/0921-5107(89)90082-2 ◽

1989 ◽

Vol 2 (1-3) ◽

pp. 91-97 ◽

Cited By ~ 6

Author(s):

G.T. Brown ◽

S.J. Barnett ◽

S.J. Courtney ◽

S.S. Gill

Keyword(s):

Mass Spectrometry ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Ion Mass Spectrometry ◽

High resolution isotopic analysis of U-bearing particles via fusion of SIMS and EDS images

Journal of Analytical Atomic Spectrometry ◽

10.1039/c6ja00149a ◽

2016 ◽

Vol 31 (7) ◽

pp. 1472-1479 ◽

Cited By ~ 8

Author(s):

Jay G. Tarolli ◽

Benjamin E. Naes ◽

Benjamin J. Garcia ◽

Ashley E. Fischer ◽

David Willingham

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Isotopic Analysis ◽

Energy Dispersive ◽

X Ray ◽

Ion Mass Spectrometry ◽

The result of fusing energy-dispersive X-ray spectroscopy (EDS) and secondary ion mass spectrometry (SIMS) images of U-bearing particles.

Detection of oxygen incorporated in molecular‐beam epitaxy grown GaAs‐on‐AlAs interfaces and AlAs layers by secondary ion mass spectrometry

Applied Physics Letters ◽

10.1063/1.110650 ◽

1993 ◽

Vol 63 (14) ◽

pp. 1924-1926 ◽

Cited By ~ 11

Author(s):

T. Someya ◽

H. Akiyama ◽

Y. Kadoya ◽

T. Noda ◽

T. Matsusue ◽

...

Keyword(s):

Mass Spectrometry ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Ion Mass Spectrometry ◽