Hot-carrier effects on radio frequency noise characteristics of LDDn-type metal–oxide–semiconductor field effect transistors

2000 ◽  
Vol 18 (2) ◽  
pp. 765-769 ◽  
Author(s):  
W. S. Kwan ◽  
C. H. Chen ◽  
M. J. Deen
Keyword(s):  
Metal Oxide ◽  
Radio Frequency ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Frequency Noise ◽  
Hot Carrier ◽  
Noise Characteristics ◽  
Hot Carrier Effects

Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors

2016 ◽  
Vol 33 (7) ◽  
pp. 076102 ◽  
Author(s):  
Qi-Wen Zheng ◽  
Jiang-Wei Cui ◽  
Hang Zhou ◽  
De-Zhao Yu ◽  
Xue-Feng Yu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Total Dose ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Hot Carrier ◽  
Hot Carrier Effects

Low-frequency noise characteristics of HfSiON gate-dielectric metal-oxide-semiconductor-field-effect transistors

2005 ◽  
Vol 86 (8) ◽  
pp. 082102 ◽  
Author(s):  
Bigang Min ◽  
Siva Prasad Devireddy ◽  
Zeynep Çelik-Butler ◽  
Ajit Shanware ◽  
Keith Green ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Gate Dielectric ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characteristics
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