Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors

2002 ◽  
Vol 41 (Part 1, No. 7A) ◽  
pp. 4427-4431 ◽  
Author(s):  
Toshiaki Tsuchiya ◽  
Toshiyuki Yoshida ◽  
Yasuhiro Sato
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Metal Oxide Semiconductor ◽  
Silicon On Insulator ◽  
Oxide Semiconductor ◽  
Floating Body ◽  
Frequency Noise ◽  
Hot Carrier ◽  
Noise Characteristics

Low-frequency noise characteristics of HfSiON gate-dielectric metal-oxide-semiconductor-field-effect transistors

2005 ◽  
Vol 86 (8) ◽  
pp. 082102 ◽  
Author(s):  
Bigang Min ◽  
Siva Prasad Devireddy ◽  
Zeynep Çelik-Butler ◽  
Ajit Shanware ◽  
Keith Green ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Gate Dielectric ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characteristics
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