New in situ electron beam patterning process for GaAs using an electron-cyclotron-resonance plasma-oxidized mask and Cl2 gas etching
1992 ◽
Vol 10
(6)
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pp. 2711
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1993 ◽
Vol 11
(6)
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pp. 2288
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1996 ◽
Vol 14
(3)
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pp. 1687
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1993 ◽
Vol 11
(4)
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pp. 1786-1791
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2020 ◽
Vol E103.C
(6)
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pp. 299-303
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2018 ◽
Vol 89
(8)
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pp. 083304
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1995 ◽
Vol 66
(11)
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pp. 5252-5256
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2009 ◽
Vol 37
(2)
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pp. 317-326
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