Bright-field analysis of field-emission cones using high-resolution transmission electron microscopy and the effect of structural properties on current stability
1994 ◽
Vol 12
(2)
◽
pp. 693
◽
2016 ◽
Vol 30
(20)
◽
pp. 1650269
◽
2006 ◽
Vol 78
(9)
◽
pp. 1651-1665
◽
1982 ◽
Vol 40
◽
pp. 722-723
◽
2002 ◽
Vol 82
(4)
◽
pp. 735-749
◽
2017 ◽