Defect characterization in floating body transistors using a single pulse charge pumping method

2021 ◽  
Vol 39 (5) ◽  
pp. 053205
Author(s):  
Manh-Cuong Nguyen ◽  
An Hoang-Thuy Nguyen ◽  
Jiyong Yim ◽  
Anh-Duy Nguyen ◽  
Mingyu Kim ◽  
...  
Keyword(s):  
Single Pulse ◽  
Floating Body ◽  
Defect Characterization ◽  
Charge Pumping ◽  
Pulse Charge

Single Pulse Charge Pumping Measurements on GaN MOS-HEMTs: Fast and Reliable Extraction of Interface Traps Density

2020 ◽  
Vol 67 (2) ◽  
pp. 444-448 ◽  
Author(s):  
Sami Alghamdi ◽  
Mengwei Si ◽  
Hagyoul Bae ◽  
Hong Zhou ◽  
Peide D. Ye
Keyword(s):  
Single Pulse ◽  
Interface Traps ◽  
Charge Pumping ◽  
Pulse Charge

Application of Single-Pulse Charge Pumping Method on Evaluation of Indium Gallium Zinc Oxide Thin-Film Transistors

2018 ◽  
Vol 65 (9) ◽  
pp. 3786-3790 ◽  
Author(s):  
Manh-Cuong Nguyen ◽  
An Hoang Thuy Nguyen ◽  
Hyungmin Ji ◽  
Jonggyu Cheon ◽  
Jin-Hyun Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Single Pulse ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Charge Pumping ◽  
Pulse Charge ◽  
Indium Gallium

Super Single Pulse Charge Pumping Technique for Profiling Interfacial Defects

2021 ◽  
pp. 1-7
Author(s):  
Yen-Pu Chen ◽  
Bikram Kishore Mahajan ◽  
Dhanoop Varghese ◽  
Srikanth Krishnan ◽  
Vijay Reddy ◽  
...  
Keyword(s):  
Single Pulse ◽  
Charge Pumping ◽  
Pulse Charge ◽  
Interfacial Defects

A Single Pulse Charge Pumping Technique for Fast Measurements of Interface States

2011 ◽  
Vol 58 (5) ◽  
pp. 1490-1498 ◽  
Author(s):  
L Lin ◽  
Zhigang Ji ◽  
Jian Fu Zhang ◽  
Wei Dong Zhang ◽  
B Kaczer ◽  
...  
Keyword(s):  
Single Pulse ◽  
Interface States ◽  
Charge Pumping ◽  
Pulse Charge

Charge Pumping and Flicker Noise-based Defect Characterization in Ferroelectric FETs

2020 ◽  
Author(s):  
Yannick Raffel ◽  
Maximilian Lederer ◽  
Ricardo Olivo ◽  
Franz Muller ◽  
Raik Hoffmann ◽  
...  
Keyword(s):  
Flicker Noise ◽  
Defect Characterization ◽  
Charge Pumping

Double-pulse charge pumping in MOSFETs

1992 ◽  
Vol 13 (6) ◽  
pp. 344-346 ◽  
Author(s):  
M. Kejhar
Keyword(s):  
Double Pulse ◽  
Charge Pumping ◽  
Pulse Charge

Charge Pumping Measurements of Radiation-Induced Interface-Trap Density in Floating-Body SOI FinFETs

2012 ◽  
Vol 59 (6) ◽  
pp. 3062-3068 ◽  
Author(s):  
E. X. Zhang ◽  
D. M. Fleetwood ◽  
G. X. Duan ◽  
C. X. Zhang ◽  
S. A. Francis ◽  
...  
Keyword(s):  
Trap Density ◽  
Floating Body ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Charge Pumping ◽  
Radiation Induced

Optically Assisted Charge Pumping on Floating-Body FETs

2010 ◽  
Vol 31 (12) ◽  
pp. 1365-1367 ◽  
Author(s):  
Sungho Kim ◽  
Sung-Jin Choi ◽  
Yang-Kyu Choi
Keyword(s):  
Floating Body ◽  
Charge Pumping
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