Single Pulse Charge Pumping Measurements on GaN MOS-HEMTs: Fast and Reliable Extraction of Interface Traps Density

2020 ◽  
Vol 67 (2) ◽  
pp. 444-448 ◽  
Author(s):  
Sami Alghamdi ◽  
Mengwei Si ◽  
Hagyoul Bae ◽  
Hong Zhou ◽  
Peide D. Ye
Keyword(s):  
Single Pulse ◽  
Interface Traps ◽  
Charge Pumping ◽  
Pulse Charge

Application of Single-Pulse Charge Pumping Method on Evaluation of Indium Gallium Zinc Oxide Thin-Film Transistors

2018 ◽  
Vol 65 (9) ◽  
pp. 3786-3790 ◽  
Author(s):  
Manh-Cuong Nguyen ◽  
An Hoang Thuy Nguyen ◽  
Hyungmin Ji ◽  
Jonggyu Cheon ◽  
Jin-Hyun Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Single Pulse ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Charge Pumping ◽  
Pulse Charge ◽  
Indium Gallium

Super Single Pulse Charge Pumping Technique for Profiling Interfacial Defects

2021 ◽  
pp. 1-7
Author(s):  
Yen-Pu Chen ◽  
Bikram Kishore Mahajan ◽  
Dhanoop Varghese ◽  
Srikanth Krishnan ◽  
Vijay Reddy ◽  
...  
Keyword(s):  
Single Pulse ◽  
Charge Pumping ◽  
Pulse Charge ◽  
Interfacial Defects

A Single Pulse Charge Pumping Technique for Fast Measurements of Interface States

2011 ◽  
Vol 58 (5) ◽  
pp. 1490-1498 ◽  
Author(s):  
L Lin ◽  
Zhigang Ji ◽  
Jian Fu Zhang ◽  
Wei Dong Zhang ◽  
B Kaczer ◽  
...  
Keyword(s):  
Single Pulse ◽  
Interface States ◽  
Charge Pumping ◽  
Pulse Charge

Double-pulse charge pumping in MOSFETs

1992 ◽  
Vol 13 (6) ◽  
pp. 344-346 ◽  
Author(s):  
M. Kejhar
Keyword(s):  
Double Pulse ◽  
Charge Pumping ◽  
Pulse Charge
Sign in / Sign up

Export Citation Format

Share Document