Precision lens assembly with alignment turning system

Optifab 2017 ◽  
2017 ◽  
Author(s):  
Wei-Yao Hsu ◽  
Fong-Zhi Chen ◽  
Cheng-Fang Ho ◽  
Chien-Yao Huang ◽  
Yi-Hao Lin ◽  
...  
Keyword(s):  
Author(s):  
Dudley M. Sherman ◽  
Thos. E. Hutchinson

The in situ electron microscope technique has been shown to be a powerful method for investigating the nucleation and growth of thin films formed by vacuum vapor deposition. The nucleation and early stages of growth of metal deposits formed by ion beam sputter-deposition are now being studied by the in situ technique.A duoplasmatron ion source and lens assembly has been attached to one side of the universal chamber of an RCA EMU-4 microscope and a sputtering target inserted into the chamber from the opposite side. The material to be deposited, in disc form, is bonded to the end of an electrically isolated copper rod that has provisions for target water cooling. The ion beam is normal to the microscope electron beam and the target is placed adjacent to the electron beam above the specimen hot stage, as shown in Figure 1.


Author(s):  
G.Y. Fan ◽  
Bruce Mrosko ◽  
Mark H. Ellisman

A lens coupled CCD camera showing single electron sensitivity has been built for TEM applications. The design is illustrated in Fig. 1. The bottom flange of a JEM-4000EX microscope is replaced by a special flange which carries a large rectangular leaded glass window, 22 mm thick. A 20 μm thick layer of red phosphor is coated on the window, and the entire window is sputter-coated with a thin layer of Au/Pt. A two-lens relay system is used to provide efficient coupling between the image on the phosphor scintillator and the CCD imager. An f1.0 lens (Goerz optical) with front focal length 71.6 mm is used as the collector. A mirror prism, of the Amici type, is used to "bend" the optical path by 90° to prevent X-rays which may penetrate the leaded glass from hitting the CCD detector. Images may be relayed directly to the camera (1:1) or demagnified by a factor of up to 3:1 by moving the lens assembly.


2007 ◽  
Vol 7 (3) ◽  
pp. 192-202 ◽  
Author(s):  
Jing Zhou ◽  
Derek Yip-Hoi ◽  
Xuemei Huang

In order to optimize turning processes, cutting forces need to be accurately predicted. This in turn requires accurate extraction of the geometry of tool-workpiece engagements (TWE) at critical points during machining. TWE extraction is challenging because the in-process workpiece geometry is continually changing as each tool pass is executed. This paper describes research on a hybrid analytical, solid modeler, and feature-based methodology for extracting TWEs generated during general turning. Although a pure solid modeler-based solution can be applied, it will be shown that because of the ability to capture different cutting tool inserts with similar geometry and to model the process in 2D, an analytical solution can be used instead of the solid modeler in many instances. This solution identifies features in the removal volumes, where the engagement conditions are not changing or changing predictably. This leads to significant reductions in the number of Boolean operations that are executed during the extraction of TWEs and associated parameters required for modeling a turning process. TWE extraction is a critical component of a virtual turning system currently under development.


2012 ◽  
Author(s):  
Ming-Ying Hsu ◽  
Yu-Chuan Lin ◽  
Chia-Yen Chan ◽  
Wei-Cheng Lin ◽  
Shenq-Tsong Chan ◽  
...  

Optifab 2019 ◽  
2019 ◽  
Author(s):  
Chung-Ying Wang ◽  
Chien-Yao Huang ◽  
Jung-Hsing Wang ◽  
Jun-Cheng Chen ◽  
Wei-Cheng Lin ◽  
...  

Procedia CIRP ◽  
2018 ◽  
Vol 77 ◽  
pp. 324-327 ◽  
Author(s):  
Eugenio Di Iorio ◽  
Rachele Bertolini ◽  
Stefania Bruschi ◽  
Andrea Ghiotti

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