Removing the echoes from terahertz pulse reflection system and sample

Author(s):  
Haishun Liu ◽  
Zhenwei Zhang ◽  
Cunlin Zhang
Keyword(s):  
Author(s):  
Lihong Cao ◽  
Manasa Venkata ◽  
Meng Yeow Tay ◽  
Wen Qiu ◽  
J. Alton ◽  
...  

Abstract Electro-optical terahertz pulse reflectometry (EOTPR) was introduced last year to isolate faults in advanced IC packages. The EOTPR system provides 10μm accuracy that can be used to non-destructively localize a package-level failure. In this paper, an EOTPR system is used for non-destructive fault isolation and identification for both 2D and 2.5D with TSV structure of flip-chip packages. The experimental results demonstrate higher accuracy of the EOTPR system in determining the distance to defect compared to the traditional time-domain reflectometry (TDR) systems.


2015 ◽  
Vol 23 (13) ◽  
pp. 17560 ◽  
Author(s):  
Yousef I. Salamin ◽  
Jian-Xing Li ◽  
Benjamin J. Galow ◽  
Christoph H. Keitel

2002 ◽  
Author(s):  
Christopher Longbottom ◽  
David A. Crawley ◽  
Bryan E. Cole ◽  
Donald D. Arnone ◽  
Vincent P. Wallace ◽  
...  

2009 ◽  
Vol 16 (12) ◽  
pp. 123104 ◽  
Author(s):  
Hai Zhang ◽  
Jianguo Wang ◽  
Changjiang Tong ◽  
Xiaoze Li ◽  
Guangqiang Wang

Frequenz ◽  
2019 ◽  
Vol 73 (1-2) ◽  
pp. 63-70
Author(s):  
Surya Prakash Singh ◽  
Nilesh K. Tiwari ◽  
M. Jaleel Akhtar

Abstract In this work, an efficient non-invasive terahertz pulse technique is proposed and investigated to determine the thickness and refractive index of each layer in an optically thick stratified media. A closed form formulations are derived for simultaneous extraction of the thickness and complex refractive index of each layer with the help of primary reflected signals from the multilayered structure. The proposed technique is numerically tested using a full wave electromagnetic simulator and is experimental verified in the millimeter wave frequency range by utilizing the power peaks corresponding to the primary reflected signals. The numerical and measured results of multilayered samples under test are in good agreement with the reference data. The proposed terahertz pulse technique can be used for non-destructive testing of the multilayered system existing in various industries.


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