Bidirectional reflectance measurement of black absorber layers for use in optical instrument design

Author(s):  
J. Robert Mahan ◽  
Kory Priestley ◽  
Vinh Q. Nguyen ◽  
Deepali Shirsekar ◽  
Yifei Wang
Author(s):  
ChandraSekhar Roychoudhuri

In the domain of light emissions, quantum mechanics has been an immensely successful guiding tool for us. In the propagation of light and optical instrument design, Huygens-Fresnel diffraction integral (HFDI) (or its advanced versions) and Maxwell’s wave equation are continuing to be the essential guiding tools for optical scientists and engineers. In fact, most branches of optical science and engineering, like optical instrument design, image processing, Fourier optics, Holography, etc., cannot exist without using the foundational postulates behind the Huygens-Fresnel diffraction integral. Further, the field of structured light is also growing where phases and the state of polarizations are manipulated usually with suitable classical macro-devices to create wave fronts that restructured through light-matter interactions through these devices. Mathematical modeling of generating such complex wave fronts generally follows classical concepts and classical macro tools of physical optics. Some of these complex light beams can impart mechanical angular momentum and spin-like properties to material particles inserted inside these structured beams because of their electromagnetic dipolar properties and/or structural anisotropy. Does that mean these newly structured beams have acquired new quantum properties without being generated through quantum devices and quantum transitions? In this chapter, we bridge the classical and quantum formalism by defining a hybrid photon (HP). HP is a quantum of energy, hν, at the initial moment of emission. It then immediately evolves into a classical time-finite wave packet, still transporting the original energy, hν, with a classical carrier frequency ν (oscillation of the E-vector). This chapter will raise enquiring questions whether all these observed “quantum-like” behaviors are manifestations of the joint properties of interacting material particles with classical EM waves or are causal implications of the existence of propagation of “indivisible light quanta” with exotic properties like spin, angular momentum, etc.


2018 ◽  
Vol 4 (11) ◽  
pp. 136 ◽  
Author(s):  
Aditya Sole ◽  
Ivar Farup ◽  
Peter Nussbaum ◽  
Shoji Tominaga

Materials with a complex visual appearance, like goniochromatic or non-diffuse, are widely used for the packaging industry. Measuring optical properties of such materials requires a bidirectional approach, and therefore, it is difficult and time consuming to characterize such a material. We investigate the suitability of using an image-based measurement setup to measure materials with a complex visual appearance and model them using two well-established reflection models, Cook–Torrance and isotropic Ward. It was learned that the complex materials typically used in the print and packaging industry, similar to the ones used in this paper, can be measured bidirectionally using our measurement setup, but with a noticeable error. Furthermore, the performance of the reflection models used in this paper shows big errors colorimetrically, especially for the goniochromatic material measured.


Author(s):  
Kristin Madsen ◽  
Finn E. Christensen ◽  
Brian W. Grefenstette ◽  
Fiona A. Harrison ◽  
Ann Hornschemeier ◽  
...  

Author(s):  
Qunzhi Zhu ◽  
Yu-Jiun Shen ◽  
Zhuomin M. Zhang

Knowledge of the bidirectional reflectance of silicon wafers is needed for the modeling prediction of the emitted and reflected radiation detected by radiometric thermometers, so that these instruments can be properly employed in industrial applications, such as rapid thermal processing chambers [1]. In a previous study [2], the bidirectional reflectance was observed to be sensitive to the surface roughness and coating configuration. For a typical silicon wafer, the surface could be polished, thin-film coated, randomly rough, or patterned. The characteristic parameters of the surface topography fall into the microscale or even nanoscale range. The present paper focuses on the bidirectional reflectance measurement of silicon wafers with thin-film coatings on their randomly rough sides. The reflectance distribution out of the incidence plane is also measured for the sake of a thorough characterization of surface scattering.


2021 ◽  
Vol 92 (9) ◽  
pp. 093501
Author(s):  
M. Ben Yaala ◽  
M.-H. Aumeunier ◽  
R. Steiner ◽  
M. Schönenberger ◽  
C. Martin ◽  
...  

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