scholarly journals Thin-film silica sol-gels doped with ion-responsive fluorescent lipid bilayers

1999 ◽  
Author(s):  
Darryl Y. Sasaki ◽  
Lauren E. Shea ◽  
Michael B. Sinclair
2021 ◽  
pp. 138726
Author(s):  
Indrė Aleknavičienė ◽  
Marija Jankunec ◽  
Tadas Penkauskas ◽  
Gintaras Valinčius

2009 ◽  
Vol 1195 ◽  
Author(s):  
Jeffrey A. Gerbec ◽  
Jimmy Granstrom ◽  
Hunaid Nulwala ◽  
Luis M. Campos ◽  
Craig Hawker

AbstractLiquid resin hybridized silica sol-gels and thiol-ene elastomers were evaluated as compatible materials to form thin film, flexible multilayered structures. Liquid resins are cast and cured in air and ambient pressure on the order of minutes. Scanning Electron Microscopy (SEM) reveals homogeneous interfaces and robust interfacial adhesion under tensile and compressive stress. Thickness of the hybrid glass and thiol-ene films range from 0.80μm to 1.5μm and 8 μm to 16 μm respectively.


2007 ◽  
Vol 43 (2) ◽  
pp. 259-268 ◽  
Author(s):  
Kazushige Yokoyama ◽  
Bradley E. Johnson ◽  
Jonathan W. Bourne
Keyword(s):  
Sol Gel ◽  

2009 ◽  
Vol 79-82 ◽  
pp. 671-674
Author(s):  
B.Y. Ren ◽  
Y.H. Gao ◽  
S.J. Wang ◽  
X.J. Zhang ◽  
N.X. Feng

Amorphous silica coating was deposited on the surface of Ni by dip-coating processing from commercial silica sol. Isothermal oxidation of the coated and uncoated specimens at 973 K to 1173 K in air was conducted to investigate the effect of the silica coating on the oxidation behavior of Ni by TGA, SEM and XRD. Results of the oxidation tests showed that the oxidation rate of Ni was reduced greatly due to the applied thin film. The possible mechanism of the effect of thin film on the oxidation of Ni was discussed.


1998 ◽  
Vol 31 (23) ◽  
pp. 8250-8257 ◽  
Author(s):  
Tonya L. Kuhl ◽  
Alan D. Berman ◽  
Sek Wen Hui ◽  
Jacob N. Israelachvili

2009 ◽  
Vol 180 (1) ◽  
pp. 106-110 ◽  
Author(s):  
Andrew L. Pierce ◽  
Salah Sommakia ◽  
Jenna L. Rickus ◽  
Kevin J. Otto

1990 ◽  
Vol 180 ◽  
Author(s):  
S. M. Melpolder ◽  
A. W. West ◽  
M. P. Cunningham ◽  
R. Sharma

ABSTRACTTwo techniques for thin film measurement were compared: an optical method combining ellipsometry and reflectance spectroscopy, and cross-sectional transmission electron microscopy. These techniques were used to measure the absolute thicknesses of titania/silica sol-gel films in the size range 0.1 to 0.8 microns. The relative advantages and disadvantages of these methods will be described in this study.


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