Poled polymer thin film gratings studied by near-field second harmonic optical microscopy and far-field optical diffraction

2003 ◽  
Author(s):  
Richard D. Schaller ◽  
Richard J. Saykally ◽  
Yuen-Ron Shen ◽  
Francois Lagugne-Labarthet
Keyword(s):  
Thin Film ◽  
Optical Microscopy ◽  
Second Harmonic ◽  
Near Field ◽  
Optical Diffraction ◽  
Far Field ◽  
Polymer Thin Film ◽  
Poled Polymer

Poled polymer thin-film gratings studied with far-field optical diffraction and second-harmonic near-field microscopy

2003 ◽  
Vol 28 (15) ◽  
pp. 1296 ◽  
Author(s):  
R. D. Schaller ◽  
R. J. Saykally ◽  
Y. R. Shen ◽  
F. Lagugné-Labarthet
Keyword(s):  
Thin Film ◽  
Second Harmonic ◽  
Near Field ◽  
Optical Diffraction ◽  
Far Field ◽  
Polymer Thin Film ◽  
Poled Polymer

SURFACE PLASMON RESONANCE ENHANCED SECOND-HARMONIC GENERATION IN POLED POLYMER THIN FILM

2003 ◽  
Vol 406 (1) ◽  
pp. 129-133 ◽  
Author(s):  
Hironori Yoshida ◽  
Ryo Naraoka ◽  
Kotaro Kajikawa ◽  
Jaehoon Hwang ◽  
Soo Young Park
Keyword(s):  
Thin Film ◽  
Surface Plasmon Resonance ◽  
Second Harmonic Generation ◽  
Surface Plasmon ◽  
Harmonic Generation ◽  
Plasmon Resonance ◽  
Second Harmonic ◽  
Polymer Thin Film ◽  
Poled Polymer

Optical gate action of a molecular thin film probed with femtosecond near-field optical microscopy

2000 ◽  
Vol 77 (9) ◽  
pp. 1283-1285 ◽  
Author(s):  
H. Kawashima ◽  
M. Furuki ◽  
S. Tatsuura ◽  
M. Tian ◽  
Y. Sato ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Microscopy ◽  
Near Field ◽  
Optical Gate

Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy

2000 ◽  
Author(s):  
Noel Axelrod ◽  
Anna Radko ◽  
Nissim Ben-Yosef ◽  
Artium Khatchatouriants ◽  
Millet Treinin ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Far Field ◽  
Atomic Force

Nano-Structures Fabrication by Laser Combined with Near-Field Scanning Optical Microscopy

2007 ◽  
Vol 329 ◽  
pp. 415-420
Author(s):  
Dong Jiang Wu ◽  
Juan Zhuang ◽  
Xu Yue Wang ◽  
Ren Ke Kang ◽  
Fu Ling Zhao
Keyword(s):  
Data Storage ◽  
Second Harmonic ◽  
Substrate Surface ◽  
Near Field ◽  
Coupling Efficiency ◽  
Laser Wavelength ◽  
Optical Diffraction ◽  
Storage Device ◽  
Feature Size ◽  
Near Field Scanning

We have developed the laser nanoprocessing technique by the integration of the fs laser and near-field scanning microscopy (NSOM). The second harmonic femtosecond laser working in the optical near-field with the assistance of NSOM equipment was applied to expose the photosensitive polymer material. The nanopatterns with feature size smaller than the laser wavelength can be fabricated. The optical diffraction limitation is therefore broken through by the near-field nanoprocessing. It was found in our experiment that the nanofabrication feature size depends strongly on the gap between the fiber probe tip and the substrate surface, as well as the laser coupling efficiency. The approach offers the advantages of high precision, speed and selectivity in nanopatterning, and is promising to be used in data storage device manufacture for higher density recording.

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