The evolution of hard x-ray tomography from the micrometer to the nanometer length scale

Author(s):  
Christoph Rau ◽  
K. M. Peterson ◽  
P. R. Jemian ◽  
T. Terry ◽  
Michael T. Harris ◽  
...  
Crystals ◽  
2016 ◽  
Vol 6 (8) ◽  
pp. 87 ◽  
Author(s):  
Cinzia Giannini ◽  
Massimo Ladisa ◽  
Davide Altamura ◽  
Dritan Siliqi ◽  
Teresa Sibillano ◽  
...  

Author(s):  
Srinivas Guruzu ◽  
Hong Liang

Our previous research has shown that Ga pin sliding again Si induces nanometer length scale crystals. In this research, we continued on with an In pin with one stroke slides on Si substrate. Applied load was varied for sliding Surface characterization was conducted using an atomic force microscope. Results showed that triangular-shaped nanocrystals were formed on Si surfaces. The height and side length of these nanocrystals depend on test conditions. In this paper, we report our findings in crystal structures and boundary properties.


2019 ◽  
Vol 168 ◽  
pp. 376-392 ◽  
Author(s):  
T. Song ◽  
M. Yan ◽  
N.A.S. Webster ◽  
M.J. Styles ◽  
J.A. Kimpton ◽  
...  
Keyword(s):  
Ex Situ ◽  

Langmuir ◽  
2008 ◽  
Vol 24 (16) ◽  
pp. 8991-8997 ◽  
Author(s):  
Surojit Pande ◽  
Achintya Kumar Sarkar ◽  
Mrinmoyee Basu ◽  
Subhra Jana ◽  
Arun Kumar Sinha ◽  
...  

Nanoscale ◽  
2016 ◽  
Vol 8 (22) ◽  
pp. 11595-11601 ◽  
Author(s):  
Jonathan W. Choi ◽  
Zhaodong Li ◽  
Charles T. Black ◽  
Daniel P. Sweat ◽  
Xudong Wang ◽  
...  

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