Laser photoelectron projection microscopy of insulating samples with sub-wavelength spatial resolution

1997 ◽  
Vol 85 (4) ◽  
pp. 690-696
Author(s):  
S. K. Sekatskii
2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Pablo Cencillo-Abad ◽  
Nikolay I. Zheludev ◽  
Eric Plum

Author(s):  
Giulia F. Mancini ◽  
Dennis F. Gardner ◽  
Michael Tanksalvala ◽  
Elisabeth R. Shanblatt ◽  
Xiaoshi Zhang ◽  
...  

1999 ◽  
Vol 588 ◽  
Author(s):  
Charles Paulson ◽  
Brian Hawkins ◽  
Jingxi Sun ◽  
Arthur B. Ellis ◽  
Leon Mccaughan ◽  
...  

AbstractA novel Near-field Scanning Optical Microscopy (NSOM) technique is used to obtain simultaneous topology, photoluminescence and photoreflectance (PR) spectra. PR spectra from GaAs surfaces were obtained and the local electric fields were calculated. Sub-wavelength resolution is expected for this technique and achieved for PL and topology measurements. Photovoltages, resulting from the high intensity of light at the NSOM tip, can limit the spatial resolution of the electric field determination.


2019 ◽  
Vol 126 (5) ◽  
pp. 642
Author(s):  
Н.В Черномырдин ◽  
А.С Кучерявенко ◽  
Е.Н Римская ◽  
И.Н Долганова ◽  
В.А Желнов ◽  
...  

A novel method of terahertz (THz) microscopy was proposed for imaging of biological tissues with sub-wavelength spatial resolution. It allows for overcoming the Abbe diffraction limit and provides a sub-wavelength resolution thanks to the solid immersion effect – i.e. to the reduction in the dimensions of electromagnetic beam caustic, when the beam is focused in free space, at a small distance (smaller than the wavelength) behind the medium featuring high refractive index. An experimental setup realizing the proposed method was developed. It uses a backward wave oscillator, as a THz-wave emitter, and a Golay cell, as a THz-wave detector. In this setup, the radiation is focused behind the silicon hemisphere in order to realize the solid immersion effect. The spatial resolution of 0.15λ was demonstrated for the developed microscope, while the measurements were carried out at the wavelength of λ=500 μm, with the metal-air interface as a test object. Such a high spatial resolution represents a significant advantage over that of the previously reported arrangements of solid immersion microscopes. The solid immersion microscopy does not imply using any diaphragms or other near-field probes for achieving the sub-wavelength spatial resolution; thus, it eliminates the energy losses associated with such elements. The proposed methods were applied for imaging of biological tissues, and the observed results highlight its potential in biology and medicine.


2000 ◽  
Vol 138 ◽  
pp. 173-174 ◽  
Author(s):  
Hiroaki Nakamura ◽  
Keiji Sawada ◽  
Hirotomo Kambe ◽  
Toshiharu Saiki ◽  
Tetsuya Sato

2019 ◽  
Vol 205 ◽  
pp. 03014
Author(s):  
Donghai Li ◽  
Matthias Nuss ◽  
Sebastian Goetz ◽  
Verena Kolb ◽  
Jens Pflaum ◽  
...  

We have developed coherent two-dimensional (2D) fluorescence micro-spectroscopy which probes the nonlinear optical response at surfaces via fluorescence detection with sub-micron spatial resolution. This enables the investigation of microscopic variations in laterally heterogeneous film samples which are of interests for sub-wavelength opto-electronic devices.


Author(s):  
R. Hutchings ◽  
I.P. Jones ◽  
M.H. Loretto ◽  
R.E. Smallman

There is increasing interest in X-ray microanalysis of thin specimens and the present paper attempts to define some of the factors which govern the spatial resolution of this type of microanalysis. One of these factors is the spreading of the electron probe as it is transmitted through the specimen. There will always be some beam-spreading with small electron probes, because of the inevitable beam divergence associated with small, high current probes; a lower limit to the spatial resolution is thus 2αst where 2αs is the beam divergence and t the specimen thickness.In addition there will of course be beam spreading caused by elastic and inelastic interaction between the electron beam and the specimen. The angle through which electrons are scattered by the various scattering processes can vary from zero to 180° and it is clearly a very complex calculation to determine the effective size of the beam as it propagates through the specimen.


Author(s):  
R.W. Carpenter

Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.


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