Study of Wide-Gap Semiconductors Using Electron-Beam Induced Current Method

2021 ◽  
Vol 66 (4) ◽  
pp. 581-593
Author(s):  
E. B. Yakimov
Keyword(s):  
Electron Beam ◽  
Current Method ◽  
Induced Current ◽  
Electron Beam Induced Current ◽  
Wide Gap

Measurement of diffusion length in CuInSe2 and CdS by the electron beam induced current method

1980 ◽  
Vol 51 (10) ◽  
pp. 5375 ◽  
Author(s):  
J. Piekoszewski ◽  
L. Castaner ◽  
J. J. Loferski ◽  
J. Beall ◽  
W. Giriat
Keyword(s):  
Electron Beam ◽  
Diffusion Length ◽  
Current Method ◽  
Induced Current ◽  
Electron Beam Induced Current

Temperature-dependent recombination velocity analysis on artificial small angle grain boundaries using electron beam induced current method

2016 ◽  
Vol 119 (6) ◽  
pp. 065302 ◽  
Author(s):  
Takuto Kojima ◽  
Tomihisa Tachibana ◽  
Yoshio Ohshita ◽  
Ronit R. Prakash ◽  
Takashi Sekiguchi ◽  
...  
Keyword(s):  
Electron Beam ◽  
Grain Boundaries ◽  
Small Angle ◽  
Current Method ◽  
Velocity Analysis ◽  
Induced Current ◽  
Temperature Dependent ◽  
Electron Beam Induced Current ◽  
Recombination Velocity
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