Micromagnetic Simulation of the Magnetoelastic Effect in Submicron Structures

2019 ◽  
Vol 61 (9) ◽  
pp. 1563-1571
Author(s):  
R. V. Gorev ◽  
O. G. Udalov
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.


2015 ◽  
Vol 327 ◽  
pp. 277-287 ◽  
Author(s):  
S. Hammouti ◽  
B. Beaugiraud ◽  
M. Salvia ◽  
C. Mauclair ◽  
A. Pascale-Hamri ◽  
...  

2015 ◽  
Vol 381 ◽  
pp. 28-33 ◽  
Author(s):  
Harald Oezelt ◽  
Alexander Kovacs ◽  
Franz Reichel ◽  
Johann Fischbacher ◽  
Simon Bance ◽  
...  

Physica B+C ◽  
1983 ◽  
Vol 119 (1-2) ◽  
pp. 119-124 ◽  
Author(s):  
S. Ishio ◽  
A. Isomura ◽  
T. Ikeda ◽  
M. Takahashi ◽  
S. Kadowaki

2004 ◽  
Vol 95 (3) ◽  
pp. 1351-1356 ◽  
Author(s):  
Chuan-bing Rong ◽  
Hong-wei Zhang ◽  
Jian Zhang ◽  
Xiao-bo Du ◽  
Shao-ying Zhang ◽  
...  

2012 ◽  
Vol 496 ◽  
pp. 306-309 ◽  
Author(s):  
Yan Ping Shi ◽  
Shu Hua Fan

A new non-contact sensor with three magnetic pole based on magnetoelastic effect was designed, and its operation principle and mathematical model of induced voltage output were given. The output characteristic of the sensor affected by field current intensity, frequency, and the gap between the probe of the sensor and the surface of the material tested was analyzed by testing. The calculation result based on the output model found by the paper accord basically with the test result. The results of the test have showed that the measuring precision and sensitivity of the sensor can meet the demands of the general practical application.


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