A New General Method for the Determination of Optical Properties of Amorphous Silicon Films
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ABSTRACTWe propose to apply a new method to model the optical response of amorphous silicon thin films. This method presents the advantage of having a good physical insight. On the other hand, although the model has been originally tested on different materials like a-Si, a-Ge and a-GaAs, we show that it is also sensitive to small differences like those that can exist between intrinsic and doped a-Si:H.
2011 ◽
Vol 383-390
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pp. 6980-6985
2008 ◽
Vol 31
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pp. 11-22
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1992 ◽
Vol 31
(Part 1, No. 3)
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pp. 768-769
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2006 ◽
Vol 326-328
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pp. 195-198
1985 ◽
Vol 12
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pp. 43-50
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1989 ◽
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pp. 579-581
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1993 ◽
Vol 65-66
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pp. 511-514
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