SOME PROBLEMS CONCERNING THE ESTIMATE OF THE DEGREE OF EQUIVALENCE IN MRA KEY COMPARISONS AND OF ITS UNCERTAINTY

Author(s):  
FRANCO PAVESE
Author(s):  
О. М. Velychko ◽  
◽  
T. B. Gordiyenko ◽  

In the framework of the Agreement of International Committee on Weights and Measures on Mutual Recognition of national standards, calibration and measurement certificates issued by national metrology institutes (NMIs), key comparisons serve as the basis for establishing calibration and measurement capabilities of NMI with implemented quality management system. On this basis, the competence of a specific NMI to perform calibration of working standards and measuring instruments for the customer laboratories is determined. In order to attract as many NMIs as possible to participate in key comparisons of standards, Regional Metrology Organizations are widely involved in conducting such comparisons. The practical application of traditional evaluation the results of key standards comparisons and displaying them in the special database of key comparisons (KCDB) of International Bureau on Weights and Measures (BIPM) may be difficult for some NMIs and for national laboratories accredited by national accreditation bodies that wish to use NMI calibration services. This is due to the fact that the KCDB BIPM only displays the degree of equivalence of a NMI standard with corresponding expanded uncertainty without any other characteristics for evaluating calibration or measurement capabilities. The paper presents a proposed alternative evaluation of results of key comparisons of standards, which simplifies the analysis of calibration services by NMIs. It envisages the use as a criterion of consistency of the results obtained from the comparisons of the En index to analyze the degree of equivalence of the NMI standard and the corresponding extended uncertainty. The practical application of the evaluation for results of key comparisons of standards of electric power is considered. This contributes to a more streamlined calibration of work standards for specific established purposes for both NMIs and accredited laboratories.


2016 ◽  
Vol 17 (3) ◽  
pp. 223
Author(s):  
Muhammad Azzumar ◽  
Agah Faisal

<p>Abstrak<br />Diseminasi nilai kalibrasi resistor standar kepada standar kerja di Puslit Metrologi - LIPI telah dilakukan. Hal ini bertujuan untuk mendapatkan hasil kalibrasi dan estimasi ketidakpastiannya yang valid dan tertelusur ke SI pada standar kerja. Desiminasi dilakukan dengan cara mengimplenmentasikan nilai kalibrasi resistor standar 1 kΩ ke resistor acuan dan kemudian ke standar kerja. Nilai yang telah diturunkan kepada standar kerja, reference multimeter, telah dibandingkan dengan nilai pengukuran yang dilakukan oleh KRISS (Korea Research Institute of Standards and Science) melalui kriteria derajat ekuivalensi. Error number berdasarkan kriteria derajat ekuivalensi antara Metrologi - LIPI dan KRISS pada resistor-resistor 100Ω, 10Ω, dan 1Ω masing-masing adalah sebesar 0,51, 0,73, dan 0,87. Berdasarkan error number tersebut, hasil pengukuran Metrologi - LIPI memiliki kesesuaian nilai ukur dengan hasil ukur KRISS. Lebih daripada itu, hal tersebut telah memvalidasi hasil kalibrasi dan estimasi ketidakpastian dari resistor acuan dan standar kerja di Puslit Metrologi - LIPI.<br />Kata kunci: nilai kalibrasi, resistor standar, standar kerja, kriteria derajat kebebasan, validasi.</p><p><br />Abstract<br />Dissemination of calibration value of standard resistor to working standard in Research Center for Metrology LIPI has been done. It aims to get the calibration result and the uncertainty estimation that are valid and traceable to SI on the working standard. The desimination was performed by implementing calibration value of 1 kΩ standard resistor to reference resistor and then to working standard. The value that had been disseminated to working standard, reference multimeter, had been compared to the measurement value made by KRISS (Korea Research Institute of Standards and Science) through a degree of equivalence criteria. The error numbers based on the degree of equivalence criteria between Metrology-LIPI and KRISS for the resistors measurement of 100Ω, 10Ω, and 1Ω were 0.51, 0.73, and 0.87 respectively. Based on those error numbers, Metrology-LIPI measurement results had the measuring value agreement with KRISS measurement results. Moreover, Its had validated calibration result and the uncertainty estimation of reference resistor and working standard in Metrology LIPI<br />Keywords: calibration value, standard resistor, working standard, degree of equivalence criteria, validation.</p>


2021 ◽  
Vol 1 ◽  
pp. 1-8
Author(s):  
Oleksandr Samoilenko ◽  
Yurii Kuzmenko

The method for processing of the measurement results obtained from Comite International des Poids et Measures (CIPM) Key, Regional Metrology Organizations (RMO) or supplementary comparisons, from the proficiency testing by interlaboratory comparisons and the calibrations is proposed. It is named by authors as adjustment by least square method (LSM). Additive and multiplicative parameters for each measuring standard of every particular laboratory will be the results of this adjustment. As well as the parameters for each artifact. The parameters of the measurements standards are their additive and multiplicative degrees of equivalence from the comparison and the estimations of the systematic errors (biases) from calibrations. The parameters of the artifacts are the key comparisons reference value from the comparison and the assigned quantity values from the calibrations. The adjustment is considered as a way to solving a problem of processing the great amount of homogeneous measurements with many measuring standards at a different comparison levels (CIPM, RMO or supplementary), including connected problems. Four different cases of the adjustments are considered. The first one is a free case of adjustment. It was named so because of the fact that none of participants has any advantage except their uncertainties of measurements. The second one is a fixed case of adjustment. Measuring results of RMO and supplementary comparisons are rigidly linked to additive and multiplicative parameters of measuring standards of particular laboratories participated in CIPM key comparisons. The third one is a case of adjustment with dependent equations. This one is not so rigidly linked of the new comparisons results to previous or to some other comparisons as for fixed case. It means that the new results of comparisons are influenced by the known additive and multiplicative parameters and vice versa. The fourth one is a free case of adjustment with additional summary equations. In that case certain checking equations are added to the system of equations. So, the sum of parameters multiplied by their weights of all measurement standards for particular laboratories participated in comparisons should be equal to zero.


Metrologia ◽  
2003 ◽  
Vol 40 (2) ◽  
pp. 18-23 ◽  
Author(s):  
Adriaan M H van der Veen ◽  
Maurice G Cox

2013 ◽  
Vol 45 (2) ◽  
pp. 425-450 ◽  
Author(s):  
James Allen Fill ◽  
Takehiko Nakama

When the search algorithm QuickSelect compares keys during its execution in order to find a key of target rank, it must operate on the keys' representations or internal structures, which were ignored by the previous studies that quantified the execution cost for the algorithm in terms of the number of required key comparisons. In this paper we analyze running costs for the algorithm that take into account not only the number of key comparisons, but also the cost of each key comparison. We suppose that keys are represented as sequences of symbols generated by various probabilistic sources and that QuickSelect operates on individual symbols in order to find the target key. We identify limiting distributions for the costs, and derive integral and series expressions for the expectations of the limiting distributions. These expressions are used to recapture previously obtained results on the number of key comparisons required by the algorithm.


MAPAN ◽  
2015 ◽  
Vol 30 (4) ◽  
pp. 267-271 ◽  
Author(s):  
S. Lee ◽  
J. W. Chung ◽  
I. M. Choi

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