HIGH RESOLUTION L X-RAY EMISSION SPECTRA OF Fe AND Cu INDUCED BY O.75 MeV/u ION IMPACT

High resolution L x-ray emission spectra of Fe and Cu have been measured by 0.75 MeV/u H and He, and 0.73 MeV/u He, Si and Ar ion impacts with a crystal spectrometer. The x-ray transition energies in the Fe and Cu targets for Lι, Lη, Lα1,2, Lβ1 and Lβ3,4 diagram lines induced by light ion impacts are determined, which are in good agreement with those given in the reference. The difference in L x-ray emission spectra produced by H, He, Si and Ar ions is considered and the emission spectra for the Cu target are compared with the calculated ones based on the multiconfiguration Dirac-Fock method. The origin of the broadening of the Lα1,2 line to the lower energy for Si and Ar ion impacts is attributed to one 2p plus one 3d electron vacancy production.

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HEAVY ION-INDUCED COPPER L X-RAY SPECTRA MEASURED WITH A HIGH RESOLUTION X-RAY CRYSTAL SPECTROMETER

International Journal of PIXE ◽

10.1142/s012908359700014x ◽

1997 ◽

Vol 07 (03n04) ◽

pp. 109-115 ◽

Cited By ~ 2

Author(s):

K. KAWATSURA ◽

T. INOUE ◽

T. IGARASHI ◽

N. TERAZAWA ◽

S. ARAI ◽

...

Keyword(s):

High Resolution ◽

Emission Spectra ◽

Heavy Ion ◽

Thick Target ◽

Crystal Spectrometer ◽

X Ray ◽

Hartree Fock ◽

Ion Impact ◽

Electron Vacancy ◽

Shell Vacancy

High resolution L X-ray emission spectra of Cu have been measured for 0.75 MeV/u H , 0.075 and 0.75 MeV/u F , and 0.075 and 0.64 MeV/u Si ion impacts with a Bragg crystal spectrometer. The high resolution X-ray spectra from the Cu thick target for L ι, L η, L α1,2, L β1, and L β3,4 transitions induced by ion excitation are obtained. The X-ray spectra produced by F and Si ion impacts have complicated structures due to multiple L and M shell vacancy production. The L X-ray emission spectra produced by heavy ion impact are compared with the calculated ones based on the Hartree-Fock-Slater method. The origin of the broadening of the L X-ray transition lines to the higher energy side for heavy ion impact is attributed to one 2p plus multiple 3p and 3d electron vacancy production.

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Resolution Enhancement for Cu Kα Emission of Y-Ba-Cu-O Compounds

Advances in X-ray Analysis ◽

10.1154/s0376030800020425 ◽

1988 ◽

Vol 32 ◽

pp. 155-165

Author(s):

N. Saitoh ◽

Y. Higashi ◽

M. Minarai ◽

S. Fukushima ◽

Y. Gohshi ◽

...

Keyword(s):

High Resolution ◽

Physical Properties ◽

Lower Energy ◽

Fluorescence Spectra ◽

Resolution Enhancement ◽

Chemical State ◽

Transition Elements ◽

Crystal Spectrometer ◽

X Ray ◽

Mechanism Of Superconductivity

Since the discovery of the Y-Ba-Cu-O superconductors, their physical properties have been investigated by various methods. The chemical state of Cu in Y-Ba-Cu-O compounds la one of the greatest issues because the mechanism of superconductivity in Y-Ba-Cu-O is not understood theoretically. We are analyzing X-ray fluorescence spectra of Cu compounds including superconductors, intending to analyze the chemical state of Cu in Y-Ba-Cu-O. As for other 3d transition elements, structures due to unpaired electrons appear clearly on the lower energy side of the Kα1 line of the element. However there are little differences observed among Cu Kα spectra of Cu compounds even if they are measured by a high-resolution two-crystal spectrometer (see Fig. 1). Although Cu is a member of 3d transition elements, its Kα spectrum shows somewhat different behavior compared with other 3d transition elements. This point is one subject we are interested in.

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A high resolution X-ray crystal spectrometer to study electron and heavy-ion impact atomic collisions

Pramana ◽

10.1007/s12043-007-0097-2 ◽

2007 ◽

Vol 68 (6) ◽

pp. 983-994 ◽

Cited By ~ 2

Author(s):

Ajay Kumar ◽

D. Misra ◽

A. H. Kelkar ◽

U. R. Kadhane ◽

K. V. Thulasiram ◽

...

Keyword(s):

High Resolution ◽

Heavy Ion ◽

Crystal Spectrometer ◽

Atomic Collisions ◽

X Ray ◽

Ion Impact

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Nano-probe x-ray analysis and high-resolution imaging on planar defects in high-pressure synthesized infinite-layer superconductor

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100171377 ◽

1994 ◽

Vol 52 ◽

pp. 728-729

Author(s):

Y. Y. Wang ◽

H. Zhang ◽

V. P. Dravid ◽

H. Zhang ◽

L. D. Marks ◽

...

Keyword(s):

High Pressure ◽

High Resolution ◽

Atomic Structure ◽

Emission Spectra ◽

High Resolution Electron Microscopy ◽

Planar Defects ◽

X Ray ◽

Infinite Layer ◽

Resolution Electron ◽

Resolution Imaging

Azuma et al. observed planar defects in a high pressure synthesized infinitelayer compound (i.e. ACuO2 (A=cation)), which exhibits superconductivity at ~110 K. It was proposed that the defects are cation deficient and that the superconductivity in this material is related to the planar defects. In this report, we present quantitative analysis of the planar defects utilizing nanometer probe xray microanalysis, high resolution electron microscopy, and image simulation to determine the chemical composition and atomic structure of the planar defects. We propose an atomic structure model for the planar defects.Infinite-layer samples with the nominal chemical formula, (Sr1-xCax)yCuO2 (x=0.3; y=0.9,1.0,1.1), were prepared using solid state synthesized low pressure forms of (Sr1-xCax)CuO2 with additions of CuO or (Sr1-xCax)2CuO3, followed by a high pressure treatment.Quantitative x-ray microanalysis, with a 1 nm probe, was performed using a cold field emission gun TEM (Hitachi HF-2000) equipped with an Oxford Pentafet thin-window x-ray detector. The probe was positioned on the planar defects, which has a 0.74 nm width, and x-ray emission spectra from the defects were compared with those obtained from vicinity regions.

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Local atomic structure in tetragonal pure ZrO2nanopowders

Journal of Applied Crystallography ◽

10.1107/s0021889809054983 ◽

2010 ◽

Vol 43 (2) ◽

pp. 227-236 ◽

Cited By ~ 16

Author(s):

Leandro M. Acuña ◽

Diego G. Lamas ◽

Rodolfo O. Fuentes ◽

Ismael O. Fábregas ◽

Márcia C. A. Fantini ◽

...

Keyword(s):

Tetragonal Phase ◽

Local Structure ◽

X Ray Diffraction ◽

X Ray ◽

Atomic Structures ◽

Crystallite Sizes ◽

Exafs Study ◽

The Difference ◽

X Ray Absorption ◽

Good Agreement

The local atomic structures around the Zr atom of pure (undoped) ZrO2nanopowders with different average crystallite sizes, ranging from 7 to 40 nm, have been investigated. The nanopowders were synthesized by different wet-chemical routes, but all exhibit the high-temperature tetragonal phase stabilized at room temperature, as established by synchrotron radiation X-ray diffraction. The extended X-ray absorption fine structure (EXAFS) technique was applied to analyze the local structure around the Zr atoms. Several authors have studied this system using the EXAFS technique without obtaining a good agreement between crystallographic and EXAFS data. In this work, it is shown that the local structure of ZrO2nanopowders can be described by a model consisting of two oxygen subshells (4 + 4 atoms) with different Zr—O distances, in agreement with those independently determined by X-ray diffraction. However, the EXAFS study shows that the second oxygen subshell exhibits a Debye–Waller (DW) parameter much higher than that of the first oxygen subshell, a result that cannot be explained by the crystallographic model accepted for the tetragonal phase of zirconia-based materials. However, as proposed by other authors, the difference in the DW parameters between the two oxygen subshells around the Zr atoms can be explained by the existence of oxygen displacements perpendicular to thezdirection; these mainly affect the second oxygen subshell because of the directional character of the EXAFS DW parameter, in contradiction to the crystallographic value. It is also established that this model is similar to another model having three oxygen subshells, with a 4 + 2 + 2 distribution of atoms, with only one DW parameter for all oxygen subshells. Both models are in good agreement with the crystal structure determined by X-ray diffraction experiments.

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Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

MRS Proceedings ◽

10.1557/proc-376-409 ◽

1994 ◽

Vol 376 ◽

Cited By ~ 2

Author(s):

M. Vrána ◽

P. Klimanek ◽

T. Kschidock ◽

P. Lukáš ◽

P. Mikula

Keyword(s):

High Resolution ◽

Neutron Diffraction ◽

Stacking Faults ◽

Metallic Materials ◽

Line Broadening ◽

X Ray Diffraction ◽

X Ray ◽

Neutron Diffractometer ◽

Residual Strains ◽

Good Agreement

ABSTRACTInvestigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

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Observing the Chemical State of Elements With Z=21 To 28 From L Alpha1 To L L Ratios With Energy Dispersive Spectroscopy (EDS)

Microscopy and Microanalysis ◽

10.1017/s1431927600016275 ◽

1999 ◽

Vol 5 (S2) ◽

pp. 590-591

Author(s):

A. Sandborg ◽

R. Anderhalt

Keyword(s):

High Resolution ◽

Atomic Number ◽

Energy Dispersive Spectroscopy ◽

Emission Spectra ◽

Outer Electron ◽

Number Range ◽

X Ray ◽

Chemical Effects ◽

Intensity Changes ◽

Electron Shells

It is well known that chemical bonding affects elemental x-ray emission spectra. The spectra of low atomic number elements show energy shifts which depend on the bonding of the element. To observe these shifts, a high resolution wavelength dispersive (WDS) x-ray spectrometer is required. Intensity variations of the L series can be observed with an EDS system which also show chemical effects.The L Alphal and the L L radiations are produced from a vacancy in the L III shell. Normally the L L line is about 5 to 6% of the intensity of the L Alphal line. However, in the atomic number range of Z=21 to 28, it is easily observed that the L L line becomes more intense. The L Alphal is no longer present at Z=20. These intensity changes are due to the outer electron shells of these atoms being unfilled. The L Alphal comes from the L3-M5 transition, while the L L comes from L3-M1 transition. The M5 (3d level) of the M shell is partially filled for Z=21 to 28; empty for Z<21and full for Z> 28. Holliday observed a Ti LL which was 17% greater than the Ti L Alphal.

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