A UNIFIED THEORY OF MEASUREMENT OF ANISOTROPIC RESISTIVITY BASED ON A SINGLE SURFACE OF ONE (FROM THIN TO THICK) FILM
2012 ◽
Vol 26
(29)
◽
pp. 1250142
A unified method and theory for measuring anisotropic resistivity based on a single surface of a film with rapidly converging exact solutions is presented here for solutions appropriate to thin films (Type I solutions) and to thick samples (Type II solutions). Some of the exact solutions of the related simultaneous equation systems can be expressed in terms of elementary functions. The theory proposed here for measuring resistivity of anisotropic crystals is expected to be useful in many applications.
1983 ◽
Vol 88
(A6)
◽
pp. 4853
◽
1987 ◽
Vol 45
◽
pp. 792-793